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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS, ICD | 2024-11-01 11:40 |
Aomori | Hirosaki University (Aomori, Online) (Primary: On-site, Secondary: Online) |
Fundamental Study on Frequency Injection Attack on True Random Number Generator Using Phase-Locked Loop Hikaru Nishiyama (AIST), Daisuke Fujimoto, Yuichi Hayashi (NAIST), Shinichi Kawamura (AIST)  HWS2024-63 ICD2024-34 |
(To be available after the conference date) [more] | HWS2024-63 ICD2024-34 pp.7-11 |
| HWS, ICD | 2024-11-01 15:15 |
Aomori | Hirosaki University (Aomori, Online) (Primary: On-site, Secondary: Online) |
A Study on the Effectiveness of 1bit-fault Model in Statistical Fault Analysis Shungo Hayashi (AIST/YNU), Junichi Sakamoto, Hikaru Nishiyama, Tsutomu Matsumoto (AIST) HWS2024-68 ICD2024-39 |
Statistical Ineffective Fault Analysis (SIFA), proposed in CHES2018, is a fault attack that uses only error-free ciphert... [more] | HWS2024-68 ICD2024-39 pp.32-37 |
| HWS | 2024-04-19 15:00 |
Tokyo | (Tokyo, Online) (Primary: On-site, Secondary: Online) |
HWS2024-2 |
(To be available after the conference date) [more] | HWS2024-2 pp.3-7 |
| EMCJ | 2023-11-24 16:15 |
Tokyo | Kikai-Shinko-Kaikan (Tokyo, Online) (Primary: On-site, Secondary: Online) |
Fundamental Study on the Influence of Frequency Multiplication Ratio of Phase-Locked loop on Fault Injection into Cryptographic Modules Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-80 |
(To be available after the conference date) [more] | EMCJ2023-80 pp.46-50 |
| ICD, HWS | 2023-10-31 13:55 |
Mie | (Mie, Online) (Primary: On-site, Secondary: Online) |
Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2023-55 ICD2023-34 |
(To be available after the conference date) [more] | HWS2023-55 ICD2023-34 pp.5-9 |
| EMCJ | 2023-06-09 16:20 |
Hokkaido | Otaru Chamber of Commerce & Industry (Hokkaido, Online) (Primary: On-site, Secondary: Online) |
Estimating Transmission Efficiency of Intentional Electromagnetic Interference Using Fault Occurrence Rate from Cryptographic Devices Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-28 |
Fault injection attacks using intentional electromagnetic interference (IEMI) against cryptographic devices have become ... [more] | EMCJ2023-28 pp.82-86 |
| HWS, ICD [detail] | 2021-10-19 10:50 |
Online | Online (Online) | Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17 |
A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] | HWS2021-43 ICD2021-17 pp.13-18 |
| EMCJ | 2019-07-18 13:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Fundamental study on influence of intentional electromagnetic interference on IC communication Hikaru Nishiyama, Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2019-23 |
Low-Power Intentional Electromagnetic Interference (IEMI) has been reported, which causes malfunction without damaging t... [more] | EMCJ2019-23 pp.29-33 |
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