Committee 
Date Time 
Place 
Paper Title / Authors 
Abstract 
Paper # 
EMD, CPM, OME 
20150619 15:55 
Tokyo 
KikaiShinkoKaikan Bldg. 
By means of a statistical method an analysis of degradation phenomenon of electrical contacts using microsliding mechanisms
 A statistical analysis using data of minimal sliding amplitudes under some conditions  Keiji Koshida, Shinichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD201517 CPM201527 OME201530 
Authors have designed and developed a mechanism to be capable of microsliding electrical contact directly by using a gi... [more] 
EMD201517 CPM201527 OME201530 pp.3540 
EMD, R 
20150220 15:20 
Shizuoka 

A method for evaluating degradation phenomenon of electrical contacts using a microsliding mechanisms
 Minimal sliding amplitudes against input waveforms under some conditions  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) R201473 EMD2014110 
Authors have designed and developed a microsliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] 
R201473 EMD2014110 pp.1320 
EMD 
20141219 14:05 
Tokyo 
KikaiShinkoKaikan Bldg 
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (8)
 The effect by application time of external force (3)  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD201495 
Authors, first, analyse the transient response and steadystate one using theoretical inputs developed by Fourier series... [more] 
EMD201495 pp.16 
EMD 
20141219 14:30 
Tokyo 
KikaiShinkoKaikan Bldg 
Degradation phenomenon of electrical contacts by using a microsliding mechanism
 The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4)  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD201496 
Authors have studied degradation phenomenon on contact resistance under the influences of an external microoscillation.... [more] 
EMD201496 pp.712 
EMD 
20141219 14:55 
Tokyo 
KikaiShinkoKaikan Bldg 
Degradation phenomenon of electrical contacts by using a microsliding mechanism and a hammering oscillation mechanism
 The effect of adding quasiimpulsive oscillation to microsliding  Shinichi Wada, Hiroki Iwamoto, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD201497 
Authors have designed and developed a hammering oscillation system which gives transient externalforce repeatedly to el... [more] 
EMD201497 pp.1318 
EMD 
20141130 14:55 
Hokkaido 
Chitose Cultural Center 
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (6)
 The effect by application time of external force  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD201491 
Authors have studied the degradation phenomenon of electrical contact under the influences of an external microoscillat... [more] 
EMD201491 pp.149154 
EMD 
20141130 15:15 
Hokkaido 
Chitose Cultural Center 
Degradation phenomenon of electrical contacts by using a microsliding mechanism
 The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3)  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD201492 
Authors have studied degradation phenomenon on contact resistance under the influences of an external microoscillation.... [more] 
EMD201492 pp.155160 
EMD, LQE, OPE, CPM, R 
20140822 15:55 
Hokkaido 
Otaru Economy Center 
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (PCB) (6)
 The effect by application time of external force  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R201449 EMD201454 CPM201469 OPE201479 LQE201453 
Authors have obtained the transient response and steadystate one using theoretical inputs developed by Fourier series a... [more] 
R201449 EMD201454 CPM201469 OPE201479 LQE201453 pp.133138 
EMD, LQE, OPE, CPM, R 
20140822 16:15 
Hokkaido 
Otaru Economy Center 
Degradation Phenomenon of Electrical Contacts by a MicroSliding Mechanism
 The comparison of the evaluated minimal sliding amplitudes  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R201450 EMD201455 CPM201470 OPE201480 LQE201454 
Authors have developed a mechanism which supplies reciprocal microsliding to electrical contacts directly driven by a p... [more] 
R201450 EMD201455 CPM201470 OPE201480 LQE201454 pp.139144 
EMD, LQE, OPE, CPM, R 
20140822 16:35 
Hokkaido 
Otaru Economy Center 
Degradation phenomenon of electrical contacts by a microsliding mechanism
 The comparison of the evaluated minimal sliding amplitudes under some conditions (2)  Keiji Koshida, Shinichi Wada, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R201451 EMD201456 CPM201471 OPE201481 LQE201455 
Authors have developed a hammering oscillating mechanism which gives microoscillation to electrical
contacts, and have... [more] 
R201451 EMD201456 CPM201471 OPE201481 LQE201455 pp.145150 
OME, EMD, CPM 
20140620 11:20 
Tokyo 
KikaiShinkoKaikan Bldg. 
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (5)
 Natural Frequency and Damping Ratio(2)  Keiji Koshida, Shinichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD201414 CPM201434 OME201422 
Authors have obtained the steadystate responses using theoretical inputs developed by Fourier series and the analytical... [more] 
EMD201414 CPM201434 OME201422 pp.3338 
NLP 
20140310 16:10 
Tokyo 
Sophia University 
Degradation Phenomenon of Electrical Contacts by using a MicroSliding Mechanism
 Modeling about Fluctuation of Contact Resistance (5)  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013176 
Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] 
NLP2013176 pp.6772 
EMD 
20140131 13:35 
Tokyo 

An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board(4)
 Natural Frequency and Damping Ratio  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013136 
Authors have obtained the steadystate responses using theoretical inputs developed by Fourier series and the analytical... [more] 
EMD2013136 pp.16 
EMD 
20131220 14:55 
Tokyo 
KikaiShinkoKaikan Bldg. 
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (3)
 Properties of the Responses using Rectangular Wave & Sinusoidal one as Input  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013133 
Authors have designed and developed the mechanism which gives vibration to electrical contacts by transient force using ... [more] 
EMD2013133 pp.1116 
EMD 
20131116 09:30 
Overseas 
Huazhong University of Science and Technology, Wuhan, P.R.China 
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board
 Properties of the Responses using Rectangular Wave and Sinusoidal one as an Input  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD201378 
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] 
EMD201378 pp.1518 
EMD 
20131116 09:45 
Overseas 
Huazhong University of Science and Technology, Wuhan, P.R.China 
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board
 Natural Frequency and Damping Ratio (2)  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD201379 
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] 
EMD201379 pp.1922 
EMCJ, EMD 
20130712 10:35 
Tokyo 
KikaiShinkoKaikan Bldg. 
Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a MicroSliding Mechanism
 A fundamental study on the performance of the hammering oscillation mechanism (28)  Shinichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ201339 EMD201324 
Authors have studied the effect on electrical contacts by actual microoscillation using the hammering oscillation mecha... [more] 
EMCJ201339 EMD201324 pp.16 
EMD, CPM, OME 
20130621 14:40 
Tokyo 
KikaiShinkoKaikan Bldg. 
Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a MicroSliding Mechanism
 A fundamental study on the performance of the hammering oscillating mechanism (27)  Shinichi Wada, Keiji Koshida, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD201317 CPM201332 OME201340 
Authors have studied the influence on electrical contacts by actual microoscillation using some oscillating mechanisms ... [more] 
EMD201317 CPM201332 OME201340 pp.5560 
NLP 
20130425 10:25 
Aichi 
Nagoya campus, Chukyo University 
Degradation Phenomenon of Electrical Contacts by using a MicroSliding Mechanism
 Modeling about Fluctuation of Contact Resistance (4)  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP20132 
Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] 
NLP20132 pp.712 
NLP 
20130314 13:50 
Chiba 
NishiChiba campus, Chiba Univ. 
Degradation Phenomenon of Electrical Contacts by using a MicroSliding Mechanism
 Modeling about Fluctuation of Contact Resistance (3)  Shinichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) NLP2012152 
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] 
NLP2012152 pp.4348 