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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EID, SDM, ITE-IDY [detail] |
2018-12-25 11:00 |
Kyoto |
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Double-Gate Cu-MIC Poly-Ge TFT on Plastic Substrate Hiroki Utsumi (Tohoku Gakuin Univ.), Kuninori Kitahara, Shinya Tsukada (Shimane Univ.), Hitoshi Suzuki, Akito Hara (Tohoku Gakuin Univ.) EID2018-4 SDM2018-77 |
Polycrystalline-germanium (poly-Ge) thin-film transistor (TFT) with double gate (DG) structure was fabricated via metal ... [more] |
EID2018-4 SDM2018-77 pp.1-4 |
MBE |
2008-09-25 13:30 |
Nagano |
Faculty of Engineering, Shinshu University |
Fundamental Research for Evaluation The Deep Vein Thrombosis Risk, by Using Epibiosis Vein Imaging Through Near-Infrared Ray Suguru Nakashima, Takumi Miyazawa, Kenta Suzuki (NUT), Hitoshi Suzuki (Advance), Kazuhiko Hanzawa (Niigata Univ.), Ichiro Fukumoto (NUT) MBE2008-47 |
By the Niigata Chuetsu earthquake generated in 2004, 10 Pulmonary embolism (PE) was reported, and 3 people of those died... [more] |
MBE2008-47 pp.115-118 |
OME |
2006-07-27 11:15 |
Kanagawa |
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Spray-jet technique for studying non-volatile molecules
-- Apparatus-development and improvement -- Toshiki Yamada, Hitoshi Suzuki, Toshiya Kamikado, Shinro Mashiko, Shiyoshi Yokoyama (NICT) |
We have developed the spray-jet technique that enables us to produce a molecular beam of non-volatile and/or thermally l... [more] |
OME2006-53 pp.17-21 |
OPE, LQE |
2006-06-30 17:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Wide-band Optical Circuits for PLC 2xN Splitters Hiroshi Ishikawa, Tomoyuki Hakuta, Masahiro Ohkawa, Hitoshi Suzuki, Makoto Horie (Photonics R&D center, Hitachi Cable, Ltd.) |
[more] |
OPE2006-27 LQE2006-31 pp.59-62 |
MBE |
2006-05-27 10:55 |
Toyama |
Toyama Univ. |
A basic study on establishment of medical equipment systems during major catastrophe
-- An assessment of required conditions in vital sign measurement instrument during disasters -- Ryouichi Kawabata, Yutaka Oda (Nagaoka Univ.), Shojiro Terashima (Niigata Int.), Hitoshi Suzuki (Advance), Akira Sahashi (Project AI), Hisashi Uchiyama, Ichiro Fukumoto (Nagaoka Univ.) |
[more] |
MBE2006-19 pp.13-16 |
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