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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
ED 2015-10-23
Aichi   Prototyping of electron emitters using heavily N-doped diamond -- Fabrication of built-in electrode and flat surface structured emitter with mold growth technique --
Taishi Ebisudani (ICU), Tomoaki Masuzawa (Shizuoka Univ.), Takatoshi Yamada (AIST), Jun Ochiai, Ichitaro Saito, Ken Okano (ICU) ED2015-64
Diamond is a suitable candidate for an electron emitter because it has characteristics such as negative electron affinit... [more] ED2015-64
ED 2014-10-21
Hokkaido Hokkaido Univ. (Faculty House Trillium) High sensitivity photodetection utilizing carrier multiplication in a-Se
Tomoaki Masuzawa (Shizuoka Univ.), Masanori Onishi, Taishi Ebisudani, Akinori Ohata, Reina Tsukimura, Jun Ochiai, Ichitaro Saito (ICU), Takatoshi Yamada (AIST), Yoichiro Neo, Hidenori Mimura (Shizuoka Univ.), Ken Okano (ICU) ED2014-67
Amorphous selenium (a-Se) is a promising material for high-sensitivity photodetector due to its high spatial resolution,... [more] ED2014-67
ED 2012-11-19
Osaka Osaka Univ. Nakanoshima Center Amorphous-selenium based Photodetector Driven by Diamond Cold Cathode
Tomoaki Masuzawa, Shingo Kuniyoshi, Masanori Onishi, Ichitaro Saito (Int'l Christian Univ.), Angel T. T. Koh, Daniel H. C. Chua (NUS), Takatoshi Yamada (AIST), Tatsuo Shimosawa (Univ. Tokyo), Ken Okano (Int'l Christian Univ.) ED2012-57
Amorphous-selenium (a-Se) based photodetectors are promising candidate for high sensitivity photo imaging devices, due t... [more] ED2012-57
ED 2010-10-25
Kyoto   Field Emission Properties of Nitrogen-doped Diamond Related with C-N Bond
Yuki Kudo (Univ. of Tsukuba/ICU), Tomoaki Masuzawa, Yusuke Sato (ICU), Ichitaro Saito (Univ. of Cambridge), Takatoshi Yamada (AIST), Angel Koh, Daniel. Chua (National Univ. of Singapore), Teruo Yoshino, W. J. Chun (ICU), Satoshi Yamasaki (AIST/Univ. of Tsukuba), Ken Okano (ICU) ED2010-130
Electron field emission measurement and Time-of-flight secondary ion mass spectroscopy (TOF-SIMS) were carried out on ni... [more] ED2010-130
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