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Committee Date Time Place Paper Title / Authors Abstract Paper #
ED, SDM 2010-07-02
12:20		 Tokyo Tokyo Inst. of Tech. Ookayama Campus A Precision Floating-Gate Mismatch Measurement Technique for Analog Applications
Won-Young Jung, Jong Min Kim, Jin-Soo Kim, Taek-Soo Kim (Dongbu HiTek) ED2010-112 SDM2010-113		  [more] ED2010-112 SDM2010-113
pp.275-278
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