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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ED
(Workshop) |
2012-06-29
12:15 |
Okinawa |
Okinawa Seinen-kaikan |
The Effects of Fluorine Implantation on 1/f noise and reliability characteristics of NMOSFET
Jae-Hyung Jang, Hyuk-Min Kwon, Ho-Young Kwak, Sung-Kyu Kwon, Seon-Man Hwang, Jong-Kwan Shin (Chungnam National Univ.), Seung-Yong Sung, Yi-Sun Chung, Da-Soon Lee, Jong-Kon Lee (Magnachip Semiconductor Inc), Hi-Deok Lee (Chungnam National Univ.) |
In this paper, the effects of fluorine implantation on flicker noise and hot-carrier reliability of N-channel MOSFETs we... [more] |
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