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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
R |
2014-11-20 13:45 |
Osaka |
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Prediction of performance degradation and lifetime for semiconductor devices using markov chain model Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) R2014-61 |
We study on a method to predict performance degradation and lifetime of semiconductor devices under the assumption that ... [more] |
R2014-61 pp.1-5 |
R |
2011-05-13 13:30 |
Kochi |
Kochi City Culture-Plaza Cul-Port |
[Invited Talk]
The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations
-- Non-electrical-contact fault localization in LSI chips -- Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) R2011-8 |
[more] |
R2011-8 pp.1-6 |
R |
2011-05-13 16:25 |
Kochi |
Kochi City Culture-Plaza Cul-Port |
Evaluation of defect-tolerance in the quantum-dot cellular automata PLA Katsuyoshi Miura, Takayuki Notsu, Koji Nakamae (Osaka Univ) R2011-13 |
At present, there are a number of research efforts that have focused on different devices that might either replace or a... [more] |
R2011-13 pp.29-34 |
ICD, CPM |
2007-01-19 11:45 |
Tokyo |
Kika-Shinko-Kaikan Bldg. |
SoC macro-block diagnosis using extracted layout information Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) |
A SoC macro-block diagnostic method using a netlist extracted from layout data is proposed. A hard IP core that does no... [more] |
CPM2006-147 ICD2006-189 pp.103-108 |
ICD, CPM |
2005-01-28 14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
LSI fault diagnosis by using functional test result and netlist extracted from CAD layout data Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka (Osaka Univ.) |
[more] |
CPM2004-170 ICD2004-215 pp.47-51 |
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