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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2014-11-20
13:45
Osaka   Prediction of performance degradation and lifetime for semiconductor devices using markov chain model
Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) R2014-61
We study on a method to predict performance degradation and lifetime of semiconductor devices under the assumption that ... [more] R2014-61
pp.1-5
R 2011-05-13
13:30
Kochi Kochi City Culture-Plaza Cul-Port [Invited Talk] The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations -- Non-electrical-contact fault localization in LSI chips --
Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) R2011-8
 [more] R2011-8
pp.1-6
R 2011-05-13
16:25
Kochi Kochi City Culture-Plaza Cul-Port Evaluation of defect-tolerance in the quantum-dot cellular automata PLA
Katsuyoshi Miura, Takayuki Notsu, Koji Nakamae (Osaka Univ) R2011-13
At present, there are a number of research efforts that have focused on different devices that might either replace or a... [more] R2011-13
pp.29-34
ICD, CPM 2007-01-19
11:45
Tokyo Kika-Shinko-Kaikan Bldg. SoC macro-block diagnosis using extracted layout information
Katsuyoshi Miura, Koji Nakamae (Osaka Univ.)
A SoC macro-block diagnostic method using a netlist extracted from layout data is proposed. A hard IP core that does no... [more] CPM2006-147 ICD2006-189
pp.103-108
ICD, CPM 2005-01-28
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. LSI fault diagnosis by using functional test result and netlist extracted from CAD layout data
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka (Osaka Univ.)
 [more] CPM2004-170 ICD2004-215
pp.47-51
 Results 1 - 5 of 5  /   
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