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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
NC, MBE (Joint) |
2010-03-10 17:00 |
Tokyo |
Tamagawa University |
[Invited Talk]
Concept, Development and Practical Applications of Optical Neurochip and Artificial Retina LSI Kazuo Kyuma (Mitsubishi Electric Corp.) MBE2009-121 NC2009-142 |
My research interests have focused on novel neural network devices based on optical information processing. The Optical... [more] |
MBE2009-121 NC2009-142 pp.113-118(MBE), pp.321-326(NC) |
NC |
2008-01-16 14:10 |
Hokkaido |
Centennial Hall, Hokkaido Univ. |
Age and Gender Estimation of Face Images by Self-Organizing Map Koichi Ikuta, Hiroshi Kage, Kazuhiko Sumi, Ken-ichi Tanaka, Kazuo Kyuma (Mitsubishi Electric Corp.) NC2007-107 |
As management of personal information becomes strict in recent years, it becomes difficult to acquire a large amount of ... [more] |
NC2007-107 pp.121-126 |
NC |
2007-01-26 14:30 |
Hokkaido |
Noboribetsu Manseikaku(Noboribetsu) |
Age estimation from Facial images using continuous category learning Koichi Ikuta, Hiroshi Kage, Ken-ichi Tanaka, Kazuo Kyuma (Mitsubishi Electric) |
[more] |
NC2006-111 pp.65-68 |
PRMU |
2006-11-23 11:25 |
Overseas |
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Pattern Recognition for Video Surveillance and Physical Security Hiroshi Kage, Makito Seki, Kazuhiko Sumi, Ken-ichi Tanaka, Kazuo Kyuma (Mitsubishi Electric) |
[more] |
PRMU2006-121 p.15 |
MVE, IE |
2006-07-13 16:45 |
Ishikawa |
Kanazawa University |
Automatic learning of defect feature in visual inspection Koichi Ikuta, Ken-ichi Tanaka, Kazuo Kyuma (Mitsubishi Electric Corp.) |
[more] |
IE2006-26 MVE2006-32 pp.43-47 |
NC |
2006-06-16 12:00 |
Okinawa |
OIST |
Performance estimation of face authentication based on auto-associative memory Hiroshi Kage, Shitaro Watanabe, Ken-ichi Tanaka, Kazuo Kyuma (Mitsbubishi Electric Corp.) |
In some situations of face authentication by face images, the system performance will be degraded caused by partial occl... [more] |
NC2006-30 pp.47-52 |
NC |
2006-06-16 13:40 |
Okinawa |
OIST |
Facial image Classification by age and gender feature using Self-organization Koichi Ikuta, Hiroshi Kage, Ken-ichi Tanaka, Kazuo Kyuma (Mitsubishi Corp.) |
[more] |
NC2006-31 pp.53-56 |
MBE, NC (Joint) |
2005-12-09 16:10 |
Aichi |
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Automatic recognition system using feature space reconstruction Koichi Ikuta, Ken-ichi Tanaka, Kazuo Kyuma (Mitsubishi Electric) |
[more] |
NC2005-88 pp.43-48 |
MBE, NC (Joint) |
2005-12-09 16:35 |
Aichi |
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Evaluation of occlusion-tolerant face authentication using auto-associative memory Hiroshi Kage, Shitaro Watanabe, Ken-ichi Tanaka, Kazuo Kyuma (Mitsbubishi Electric Corporation) |
Even the latest face authentication systems still have problems caused by illumination condition, face pose, facial expr... [more] |
NC2005-89 pp.49-54 |
NLP |
2004-11-26 15:10 |
Fukuoka |
Kyushu Inst. Tech. |
* Hiroshi Kage, Manabu Hashimoto, Ken-ichi Tanaka, Kazuo Kyuma (Mitsubishi Electric) |
[more] |
NLP2004-71 pp.25-28 |
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