IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 32  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2024-02-28
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. System design using DICE-based edge-triggered soft-error-tolerant D-FF
Kazuteru Namba (Chiba Univ.) DC2023-95
The recent miniaturization of VLSI has made the effects of
radiation-induced soft errors more serious.
From this, many... [more]
DC2023-95
pp.7-10
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-16
15:55
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
WGAN-GP based AI accelerator fault detection and fault classification analysis
Shuming Xu, Kazuteru Namba (Chiba Univ.) VLD2023-59 ICD2023-67 DC2023-66 RECONF2023-62
 [more] VLD2023-59 ICD2023-67 DC2023-66 RECONF2023-62
pp.150-155
SANE 2023-11-13
13:05
Chiba Chiba Univ. (Nishi-Chiba Campus)
(Primary: On-site, Secondary: Online)
Board design of digital chirp generator using FPGA
Yoshiaki Saito, Kazuteru Namba, Josaphat Tetuko Sri Sumantyo (Chiba Univ.) SANE2023-52
Remote sensing, which enables observation of an object without touching it, has been widely used for earth observation i... [more] SANE2023-52
pp.28-33
CPSY, DC, IPSJ-ARC [detail] 2023-08-03
11:45
Hokkaido Hakodate Arena
(Primary: On-site, Secondary: Online)
Design of soft-error tolerant non-volatile flip-flops
Shogo Takahashi, Kazuteru Namba (Chiba Univ.) CPSY2023-13 DC2023-13
In recent years,the incidence of soft errors in VLSI has been increasing due to miniaturization,higher integration,and l... [more] CPSY2023-13 DC2023-13
pp.31-36
DC 2022-12-16
14:10
Yamaguchi
(Primary: On-site, Secondary: Online)
Stuck-at Fault Tolerance in DNN Using Outliers and Sampling
Tomohiro Ishii, Kazuteru Namba (Chiba Univ.) DC2022-75
The development of artificial intelligence and the expansion of big data have led to the implementation of neural networ... [more] DC2022-75
pp.17-20
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2022-11-28
15:25
Kumamoto  
(Primary: On-site, Secondary: Online)
A 6T-8T hybrid SRAM for reducing the power of neural network by lowing the operating voltage
Ruoxi Yu, Kazuteru Namba (Chiba Univ.) VLD2022-24 ICD2022-41 DC2022-40 RECONF2022-47
With advances in artificial intelligence and machine learning technologies, many deep learning applications are being de... [more] VLD2022-24 ICD2022-41 DC2022-40 RECONF2022-47
pp.31-36
SANE 2022-11-10
13:50
Chiba Chiba Univ. (Nishi-Chiba Campus)
(Primary: On-site, Secondary: Online)
Development of CP-SAR image processing system using high-level synthesis
Takumi Aoyama, Kazuteru Namba, Josaphat Tetuko Sri Sumantyo (Chiba Univ.) SANE2022-56
(To be available after the conference date) [more] SANE2022-56
pp.35-38
CPSY, DC, IPSJ-ARC [detail] 2022-10-11
16:15
Niigata Yuzawa Toei Hotel
(Primary: On-site, Secondary: Online)
Low power quantized neural network by reducing the operating voltage of SRAM
Ji Wu, Kazuteru Namba (Chiba Univ) CPSY2022-20 DC2022-20
With the advancement of artificial intelligence technologies, neural networks have been attracting attention as a machin... [more] CPSY2022-20 DC2022-20
pp.14-19
SANE 2021-12-16
14:55
Chiba Chiba University
(Primary: On-site, Secondary: Online)
Comparison of HLS and IP core for CP-SAR images processing onboard UAV
Yuta Tanaka, Takumi Aoyama, Kazuteru Namba, Josaphat Tetuko Sri Sumantyo (Chiba Univ) SANE2021-76
(To be available after the conference date) [more] SANE2021-76
pp.75-78
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2021-12-01
11:35
Online Online Low power neural network by reducing the operating voltage of SRAM
Keisuke Kozu, Kazuteru Namba (Chiba Univ.) VLD2021-25 ICD2021-35 DC2021-31 RECONF2021-33
With the advancement of machine learning technology, networks are becoming more and more complex and computationally int... [more] VLD2021-25 ICD2021-35 DC2021-31 RECONF2021-33
pp.49-53
DC, CPSY, IPSJ-ARC [detail] 2021-10-11
16:00
Online Online Edge triggered D Flip-Flop using complementarity of DICE
Noriki Matsuura, Kazuteru Namba (Chiba Univ.) CPSY2021-15 DC2021-15
In recent years, the probability of soft errors has been increasing due to the miniaturization, high integration, and lo... [more] CPSY2021-15 DC2021-15
pp.19-24
CPSY, DC, IPSJ-ARC [detail] 2021-07-20
12:00
Online Online Content addressable memory using multi-level cell phase-change memory
Tomohiro Takahashi, Kazuteru Namba (Chiba Univ.) CPSY2021-1 DC2021-1
 [more] CPSY2021-1 DC2021-1
pp.1-6
SANE 2020-11-25
14:15
Online Online Design of CP-SAR image processing system board using FPGA
Motoharu Muroga, Kazuteru Namba, Josaphat Tetuko Sri Sumantyo (Chiba Univ.) SANE2020-34
We are conducting an experiment for Circularly Polarized Synthetic Aperture Radar (CP-SAR) using Unmanned Aerial Vehicle... [more] SANE2020-34
pp.43-47
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-17
10:55
Online Online DET Flip-Flops with SEU Detection Capability Using DICE and C-Element
Xu Haijia, Kazuteru Namba (Chiba Univ.) VLD2020-14 ICD2020-34 DC2020-34 RECONF2020-33
Abstract A dual-edge-triggered flip-flop (DET-FF) composed of DICE latch (Dual Interlocked Storage Cell) and C-element ... [more] VLD2020-14 ICD2020-34 DC2020-34 RECONF2020-33
pp.18-23
DC, CPSY, IPSJ-ARC [detail] 2020-10-12
14:10
Online Online Soft error tolerant SR latch using C-element
Ibuki Nakata, Kazuteru Namba (Chiba Univ) CPSY2020-19 DC2020-19
VLSI systems have become downsized, high integrated and low-power. As a result, the incidence of soft errors is increasi... [more] CPSY2020-19 DC2020-19
pp.12-15
SANE 2012-11-30
14:55
Chiba Chiba University Keyaki Kaikan Implementation of UAV on-board CP-SAR image processing system to Virtex-6 FPGA
Takuma Kusama, Kazuteru Namba, Josaphat Tetuko Sri Sumantyo (Chiba Univ.) SANE2012-114
Synthetic Aperture Radar (SAR) is an imaging sensor that can be operated in all-weather and day-night time, and has a fe... [more] SANE2012-114
pp.21-26
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-28
13:50
Miyazaki NewWelCity Miyazaki A Dynamically Configurable NoC Test Access Mechanism
Takieddine Sbiai, Kazuteru Namba, Hideo Ito (Chiba Univ.) VLD2011-60 DC2011-36
When designing a system on chip (SoC), a test access mechanism (TAM) is required to deliver test data and to collect tes... [more] VLD2011-60 DC2011-36
pp.49-54
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-29
10:15
Miyazaki NewWelCity Miyazaki CP-SAR Image Processing System Using Two FPGA Board and PC in UAV
Koshi Oishi, Kazuteru Namba, Hideo Ito, Josaphat Tetuko Sri Sumantyo (Chiba Univ.) RECONF2011-47
We are developing a microsatellite with a circularly polarized synthetic aperture radar (CP-SAR) sensor. Traditionally, ... [more] RECONF2011-47
pp.37-41
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-29
09:25
Miyazaki NewWelCity Miyazaki Improvement of Test Data Compression Rate for Chiba-Scan Testing by Reconstructing Scan Chain
Masato Akagawa, Kazuteru Namba, Hideo Ito (Chiba univ.) VLD2011-72 DC2011-48
Scan design is one of design for testing. Chiba-Scan proposed in 2005 is one of scan design for delay fault testing. Chi... [more] VLD2011-72 DC2011-48
pp.121-126
DC, CPSY 2010-04-13
15:40
Tokyo   BILBO FF with soft error correcting capability
Kazuteru Namba, Hideo Ito (Chiba Univ.) CPSY2010-4 DC2010-4
This paper presents a construction of a flip-flop (FF) that works as a soft error correcting FF in system operations and... [more] CPSY2010-4 DC2010-4
pp.15-20
 Results 1 - 20 of 32  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan