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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| VLD, RECONF | 2025-01-16 09:50 |
Kanagawa | Yokohama Technology Campus Flagship Building (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
Implementation of an Error Correcting Decoder for Surface Code Using Greedy Algorithm on ASIC by RTL and Behavioral Synthesis Ren Aoyama (KIT), Junichiro Kaodomoto (UTokyo), Kazutoshi Kobayashi (KIT)  VLD2024-78 RECONF2024-108 |
Quantum computers are expected to address the limitations of performance improvement due to the miniaturization of class... [more] | VLD2024-78 RECONF2024-108 pp.13-17 |
| RECONF, VLD | 2024-01-29 14:40 |
Kanagawa | AIRBIC Meeting Room 1-4 (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
VLD2023-85 RECONF2023-88 |
We are developing a signal processing ASIC designed to operate at extremely low temperatures with the goal of realizing ... [more] | VLD2023-85 RECONF2023-88 pp.31-34 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-15 13:10 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Kumamoto, Online) (Primary: On-site, Secondary: Online) |
Frequency Dependence of Soft Error Rates Induced by Alpha-Particle and Heavy Ion Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36 |
[more] | VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36 pp.19-24 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-15 13:35 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Kumamoto, Online) (Primary: On-site, Secondary: Online) |
Data Pattern Dependence of the Total Ionizing Dose Effect in Floating-gate and Charge-trap TLC NAND flash memories Taiki Ozawa, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-34 ICD2023-42 DC2023-41 RECONF2023-37 |
[more] | VLD2023-34 ICD2023-42 DC2023-41 RECONF2023-37 pp.25-30 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-15 14:00 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Kumamoto, Online) (Primary: On-site, Secondary: Online) |
Evaluation of SEU Sensitivity by Alpha-Particle on PMOS and NMOS Transistors in a 65 nm bulk Process Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38 |
[more] | VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38 pp.31-36 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-15 15:30 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Kumamoto, Online) (Primary: On-site, Secondary: Online) |
Error Correction Decoder of the Surface Code designed in a 22-nm Bulk Process for Fault Torelant Quantum Computers Ren Aoyama (KIT), Junichiro Kadomoto (UTokyo), Kazutoshi Kobayashi (KIT) VLD2023-38 ICD2023-46 DC2023-45 RECONF2023-41 |
Error correction is mandatory to realize a quantum computer that can perform practical calculations. Surface codes is... [more] |
VLD2023-38 ICD2023-46 DC2023-45 RECONF2023-41 pp.49-53 |
| ICD | 2023-04-10 09:55 |
Kanagawa | (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
[Invited Lecture]
Nonvolatile Storage Cells Using FiCC for IoT Processors with Intermittent Operations Yuki Abe, Kazutoshi Kobayashi (KIT), Jun Shiomi (Osaka Univ.), Hiroyuki Ochi (Ritsumeikan Univ.) ICD2023-1 |
Energy harvesting is a key technology to supply power for Internet of Things (IoT) devices. Computing devices for IoTs m... [more] | ICD2023-1 pp.1-6 |
| HWS, VLD | 2023-03-01 11:00 |
Okinawa | (Okinawa, Online) (Primary: On-site, Secondary: Online) |
Measured Evaluation of BTI Degradation in a 65nm FDSOI Process using Ring Oscillators with Same Circuit Structure Daisuke Kikuta (KIT), Ryo Kishida (TPU), Kazutoshi Kobayashi (KIT) VLD2022-73 HWS2022-44 |
(To be available after the conference date) [more] | VLD2022-73 HWS2022-44 pp.1-6 |
| IPSJ-SLDM, RECONF, VLD [detail] | 2023-01-24 10:30 |
Kanagawa | Raiosha, Hiyoshi Campus, Keio University (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
Measurement results of soft error tolerance of LPDDR4 SDRAM and GDDR5 SDRAM Motoki Kamibayashi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Masanori Hashimoto (Kyoto Univ.) VLD2022-65 RECONF2022-88 |
In recent years, as the memory capacity of computer systems has increased,the reliability of the system has decreased.So... [more] | VLD2022-65 RECONF2022-88 pp.34-39 |
| VLD, HWS [detail] | 2022-03-07 14:05 |
Online | Online (Online) | Measurement Results of Nonvolatile Flip-Flops Using FiCC for IoT Processors with Intermittent Operations Yuki Abe, Kazutoshi Kobayashi (KIT), Hiroyuki Ochi (Ritsumeikan Univ.) VLD2021-85 HWS2021-62 |
In recent years, with the spread of the Internet of Things (IoT) and mobile devices, low power consumption of processors... [more] | VLD2021-85 HWS2021-62 pp.45-50 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2021-12-01 09:20 |
Online | Online (Online) | Soft Errors on Flip-flops Depending on Circuit and Layout Structures Estimated by TCAD Simulations Moeka Kotani, Ryuichi Nakajima (KIT), Kazuya Ioki (ROHM), Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25 |
We compare the soft error tolerance of conventional flip-flops (FFs) and the proposed radiation-hard FF with small area,... [more] | VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25 pp.1-6 |
| SIP, CAS, VLD, MSS | 2021-07-05 13:30 |
Online | Online (Online) | [Panel Discussion]
[Panel Discussion] The Role of System and Signal Processing Subsociety
-- Challenge to IoT (Internet of Things) issues -- Hideaki Okazaki (SIT), Hiroki Sato (SONY), Kazutoshi Kobayashi (KIT), Atsuo Ozaki (OIT), Kazunori Hayashi (KU), Toshihisa Tanaka (TUAT) CAS2021-4 VLD2021-4 SIP2021-14 MSS2021-4 |
The four technical committees (TCs) of Systems and Signal Processing sub-society, i.e., TCs of Circuits and Systems (CA... [more] |
CAS2021-4 VLD2021-4 SIP2021-14 MSS2021-4 pp.16-18 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 09:30 |
Online | Online (Online) | Design of Nonvolatile SRAM Using SONOS Flash Cell and its Evaluation by Circuit Simulation Takaki Urabe, Koji Nii, Kazutoshi Kobayashi (KIT) VLD2020-11 ICD2020-31 DC2020-31 RECONF2020-30 |
In this paper, we designed a layout of a nonvolatile SRAM memory using the SONOS Flash memory, and investigated its char... [more] | VLD2020-11 ICD2020-31 DC2020-31 RECONF2020-30 pp.1-5 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-18 14:00 |
Online | Online (Online) | Measurement Results of Total Ionizing Dose Effect on Ring Oscillators Fabricated by a Thin-BOX FDSOI Process for Outer-space Mission Takashi Yoshida, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2020-30 ICD2020-50 DC2020-50 RECONF2020-49 |
The Total Ionizing Dose (TID) effect is one of the major concerns for semiconductor devices in outer space, where high a... [more] | VLD2020-30 ICD2020-50 DC2020-50 RECONF2020-49 pp.110-114 |
| IPSJ-SLDM, RECONF, VLD, CPSY, IPSJ-ARC [detail] | 2020-01-24 15:25 |
Kanagawa | Raiosha, Hiyoshi Campus, Keio University (Kanagawa) | Measuring SER by Neutron Irradiation Between Volatile SRAM-based and Nonvolatile Flash-based FPGAs Yuya Kawano, Yuto Tsukita, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2019-90 CPSY2019-88 RECONF2019-80 |
[more] | VLD2019-90 CPSY2019-88 RECONF2019-80 pp.217-222 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 09:15 |
Ehime | Ehime Prefecture Gender Equality Center (Ehime) | NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement Takumi Hosaka (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), RYO Kishida (Tokyo Univ. of Science), Takashi Matsumoto (The Univ. of Tokyo), Kazutoshi Kobayashi (Kyoto Institute of Tech.) VLD2019-35 DC2019-59 |
In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on ... [more] | VLD2019-35 DC2019-59 pp.57-62 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-07 14:10 |
Hiroshima | Satellite Campus Hiroshima (Hiroshima) | Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller Hiroki Nakano (KIT), Ryo Kishida (TUS), Jun Furuta, Kazutoshi Kobayashi (KIT) CPM2018-95 ICD2018-56 IE2018-74 |
[more] | CPM2018-95 ICD2018-56 IE2018-74 pp.31-36 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-07 13:45 |
Hiroshima | Satellite Campus Hiroshima (Hiroshima) | A Radiation-hard Low-delay Flip-Flop with Stacking Structure for SOI Process Mitsunori Ebara, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2018-69 DC2018-55 |
[more] | VLD2018-69 DC2018-55 pp.203-208 |
| SDM, ICD, ITE-IST [detail] | 2018-08-07 11:30 |
Hokkaido | Hokkaido Univ., Graduate School of IST M Bldg., M151 (Hokkaido) | Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) SDM2018-28 ICD2018-15 |
(To be available after the conference date) [more] | SDM2018-28 ICD2018-15 pp.15-20 |
| VLD, HWS (Joint) |
2018-02-28 17:20 |
Okinawa | Okinawa Seinen Kaikan (Okinawa) | Evaluation of a Radiation-Hardened Method and Soft Error Resilience on Stacked Transistors in 28/65 nm FDSOI Processes Haruki Maruoka, Kodai Yamada, Mitsunori Ebara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2017-103 |
The continuous downscaling of transistors has resulted in an increase of reliability issues for semiconductor chips. In ... [more] | VLD2017-103 pp.85-90 |
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