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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| CPM, ED, EID, SDM, ICD, MRIS, QIT, SCE, OME, EMD (Joint) [detail] |
2018-03-08 15:15 |
Shizuoka | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 4 -- Keiji Koshida, Shin-ichi Wada (TMC), Koichiro Sawa (NIT)  EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 |
Authors have studied degradation phenomena on electrical contacts under oscillations. In addition, they have developed a... [more] | EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 pp.15-20 |
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| EMD | 2017-11-17 10:30 |
Tokyo | The University of Electro-Communications | A Method for Evaluating Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism
-- Minimal Sliding Amplitudes against Input Waveforms (3) -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2017-44 |
The authors obtaine experimental results on the minimal sliding amplitude (MSA) required to make resistances fluctuate o... [more] | EMD2017-44 pp.7-12 |
| EMD | 2016-11-03 13:55 |
Hyogo | Awaji Yumebutai International Conference Center | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 2 -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2016-52 |
Authors have studied degradation phenomenon on electrical contacts under the influences of an external micro-oscillation... [more] | EMD2016-52 pp.11-16 |
| EMD | 2015-11-05 15:35 |
Miyagi | Tohoku University, School of engineering, Aoba memorial hall | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-70 |
[more] | EMD2015-70 pp.17-21 |
| EMD | 2015-11-05 16:00 |
Miyagi | Tohoku University, School of engineering, Aoba memorial hall | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board by a Hammering Oscillation Mechanism
-- Natural Frequency -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-71 |
[more] | EMD2015-71 pp.23-28 |
| EMD | 2015-10-02 16:50 |
Saitama | Fuji Electric FA Components & SystemCo.,Ltd. | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-66 |
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] | EMD2015-66 pp.37-42 |
| EMD, CPM, OME | 2015-06-19 15:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | By means of a statistical method an analysis of degradation phenomenon of electrical contacts using micro-sliding mechanisms
-- A statistical analysis using data of minimal sliding amplitudes under some conditions -- Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2015-17 CPM2015-27 OME2015-30 |
Authors have designed and developed a mechanism to be capable of micro-sliding electrical contact directly by using a gi... [more] | EMD2015-17 CPM2015-27 OME2015-30 pp.35-40 |
| EMD, R | 2015-02-20 15:20 |
Shizuoka | A method for evaluating degradation phenomenon of electrical contacts using a micro-sliding mechanisms
-- Minimal sliding amplitudes against input waveforms under some conditions -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) R2014-73 EMD2014-110 |
Authors have designed and developed a micro-sliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] | R2014-73 EMD2014-110 pp.13-20 |
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| EMD | 2014-12-19 14:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (8)
-- The effect by application time of external force (3) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-95 |
Authors, first, analyse the transient response and steady-state one using theoretical inputs developed by Fourier series... [more] | EMD2014-95 pp.1-6 |
| EMD | 2014-12-19 14:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Degradation phenomenon of electrical contacts by using a micro-sliding mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-96 |
Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] | EMD2014-96 pp.7-12 |
| EMD | 2014-12-19 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Degradation phenomenon of electrical contacts by using a micro-sliding mechanism and a hammering oscillation mechanism
-- The effect of adding quasi-impulsive oscillation to micro-sliding -- Shin-ichi Wada, Hiroki Iwamoto, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-97 |
Authors have designed and developed a hammering oscillation system which gives transient external-force repeatedly to el... [more] | EMD2014-97 pp.13-18 |
| EMD | 2014-11-30 14:55 |
Hokkaido | Chitose Cultural Center | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (6)
-- The effect by application time of external force -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-91 |
Authors have studied the degradation phenomenon of electrical contact under the influences of an external micro-oscillat... [more] | EMD2014-91 pp.149-154 |
| EMD | 2014-11-30 15:15 |
Hokkaido | Chitose Cultural Center | Degradation phenomenon of electrical contacts by using a micro-sliding mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-92 |
Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] | EMD2014-92 pp.155-160 |
| EMD, LQE, OPE, CPM, R | 2014-08-22 15:55 |
Hokkaido | Otaru Economy Center | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (PCB) (6)
-- The effect by application time of external force -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-49 EMD2014-54 CPM2014-69 OPE2014-79 LQE2014-53 |
Authors have obtained the transient response and steady-state one using theoretical inputs developed by Fourier series a... [more] | R2014-49 EMD2014-54 CPM2014-69 OPE2014-79 LQE2014-53 pp.133-138 |
| EMD, LQE, OPE, CPM, R | 2014-08-22 16:15 |
Hokkaido | Otaru Economy Center | Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism
-- The comparison of the evaluated minimal sliding amplitudes -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54 |
Authors have developed a mechanism which supplies reciprocal micro-sliding to electrical contacts directly driven by a p... [more] | R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54 pp.139-144 |
| EMD, LQE, OPE, CPM, R | 2014-08-22 16:35 |
Hokkaido | Otaru Economy Center | Degradation phenomenon of electrical contacts by a micro-sliding mechanism
-- The comparison of the evaluated minimal sliding amplitudes under some conditions (2) -- Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 |
Authors have developed a hammering oscillating mechanism which gives micro-oscillation to electrical contacts, and have... [more] |
R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 pp.145-150 |
| OME, EMD, CPM | 2014-06-20 11:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (5)
-- Natural Frequency and Damping Ratio(2) -- Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-14 CPM2014-34 OME2014-22 |
Authors have obtained the steady-state responses using theoretical inputs developed by Fourier series and the analytical... [more] | EMD2014-14 CPM2014-34 OME2014-22 pp.33-38 |
| NLP | 2014-03-10 16:10 |
Tokyo | Sophia University | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- Modeling about Fluctuation of Contact Resistance (5) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-176 |
Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] | NLP2013-176 pp.67-72 |
| EMD | 2014-01-31 13:35 |
Tokyo | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board(4)
-- Natural Frequency and Damping Ratio -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-136 |
Authors have obtained the steady-state responses using theoretical inputs developed by Fourier series and the analytical... [more] | EMD2013-136 pp.1-6 |
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| EMD | 2013-12-20 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (3)
-- Properties of the Responses using Rectangular Wave & Sinusoidal one as Input -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013-133 |
Authors have designed and developed the mechanism which gives vibration to electrical contacts by transient force using ... [more] | EMD2013-133 pp.11-16 |
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