Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
CPM, ED, EID, SDM, ICD, MRIS, QIT, SCE, OME, EMD (Joint) [detail] |
2018-03-08 15:15 |
Shizuoka |
(Shizuoka) |
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 4 -- Keiji Koshida, Shin-ichi Wada (TMC), Koichiro Sawa (NIT) EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 |
Authors have studied degradation phenomena on electrical contacts under oscillations. In addition, they have developed a... [more] |
EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 pp.15-20 |
EMD |
2017-11-17 10:30 |
Tokyo |
The University of Electro-Communications (Tokyo) |
A Method for Evaluating Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism
-- Minimal Sliding Amplitudes against Input Waveforms (3) -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2017-44 |
The authors obtaine experimental results on the minimal sliding amplitude (MSA) required to make resistances fluctuate o... [more] |
EMD2017-44 pp.7-12 |
EMD |
2016-11-03 13:55 |
Hyogo |
Awaji Yumebutai International Conference Center (Hyogo) |
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 2 -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2016-52 |
Authors have studied degradation phenomenon on electrical contacts under the influences of an external micro-oscillation... [more] |
EMD2016-52 pp.11-16 |
EMD |
2015-11-05 15:35 |
Miyagi |
Tohoku University, School of engineering, Aoba memorial hall (Miyagi) |
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-70 |
[more] |
EMD2015-70 pp.17-21 |
EMD |
2015-11-05 16:00 |
Miyagi |
Tohoku University, School of engineering, Aoba memorial hall (Miyagi) |
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board by a Hammering Oscillation Mechanism
-- Natural Frequency -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-71 |
[more] |
EMD2015-71 pp.23-28 |
EMD |
2015-10-02 16:50 |
Saitama |
Fuji Electric FA Components & SystemCo.,Ltd. (Saitama) |
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-66 |
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] |
EMD2015-66 pp.37-42 |
EMD, CPM, OME |
2015-06-19 15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
By means of a statistical method an analysis of degradation phenomenon of electrical contacts using micro-sliding mechanisms
-- A statistical analysis using data of minimal sliding amplitudes under some conditions -- Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2015-17 CPM2015-27 OME2015-30 |
Authors have designed and developed a mechanism to be capable of micro-sliding electrical contact directly by using a gi... [more] |
EMD2015-17 CPM2015-27 OME2015-30 pp.35-40 |
EMD, R |
2015-02-20 15:20 |
Shizuoka |
(Shizuoka) |
A method for evaluating degradation phenomenon of electrical contacts using a micro-sliding mechanisms
-- Minimal sliding amplitudes against input waveforms under some conditions -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) R2014-73 EMD2014-110 |
Authors have designed and developed a micro-sliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] |
R2014-73 EMD2014-110 pp.13-20 |