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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DE |
2018-06-22 13:00 |
Tokyo |
LIFULL Co., Ltd. |
[Short Paper]
A Consideration on User's Review Selection and Feature Extraction for Search Engine of Sightseeing Spot Kenta Han, Daisuke Kitayama (Kogakuin Univ>) DE2018-5 |
When planning sightseeing spots, tourists often plan using tourist information on the Web.However, tourists are not easy... [more] |
DE2018-5 pp.21-24 |
BioX (2nd) |
2013-08-27 14:45 |
Osaka |
The Institute of Scientific and Industrial Research, Osaka Univ. |
Paper-Type Dependency in Visible-Light Paper Artifact-Metrics Kenta Hanaki, Tsutomu Matsumoto (YNU) |
Visible-light paper artifact-metrics is a paper authentication technology based on image patterns of visible light refle... [more] |
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IT, ISEC, WBS |
2013-03-08 11:45 |
Osaka |
Kwansei Gakuin Univ., Osaka-Umeda Campus |
Nano Artifact-metrics based on Resist Collapsing Tsutomu Matsumoto, Kenta Hanaki, Ryosuke Suzuki, Daiki Sekiguchi (Yokohama National Univ.), Morihisa Hoga, Yasuyuki Ohyagi (DNP), Makoto Naruse (NICT), Naoya Tate, Motoichi Ohtsu (Univ. of Tokyo) IT2012-96 ISEC2012-114 WBS2012-82 |
Artifact-metrics is an automated method of utilizing physical artifacts based on their measurable intrinsic characterist... [more] |
IT2012-96 ISEC2012-114 WBS2012-82 pp.217-222 |
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