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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2012-10-25
15:45		 Miyagi Tohoku Univ. (Niche) AR-XPS and HAX-PES Studies on Chemical bonding states at SiO2/SiC Interfaces
Hazuki Okada, Arata Komatsu, Masato Watanabe (Tokyo City Univ.), Yudai Izumi, Takayuki Muro (JASRI), Kentaro Sawano, Hiroshi Nohira (Tokyo City Univ.) SDM2012-90		 (To be available after the conference date) [more] SDM2012-90
pp.5-9
SDM 2012-06-21
13:35		 Aichi VBL, Nagoya Univ. Surface Segregation Behavior of B, Ga, Sb, and As Dopant Atoms on Ge(100) and Ge(111) Examined with a First-principles Method
Fumiya Iijima, Kentaro Sawano (TCU), Jiro Ushio (CRL), Takuya Maruizumi, Yasuhiro Shiraki (TCU) SDM2012-52		 To understand surface segregation behaviour of B, Ga, As, and Sb dopant atoms on Ge (100) and Ge (111) surfaces, the pot... [more] SDM2012-52
pp.47-51
SDM 2011-10-21
09:00		 Miyagi Tohoku Univ. (Niche) [Invited Talk] Study of HfO2/Si/strained-Ge/SiGe using Angle Resolved x-ray Photoelectron Spectroscopy
Hiroshi Nohira, Arata Komatsu, Kentarou Nasu, Yusuke Hoshi, Toru Kurebayashi, Kentaro Sawano (Tokyo City Univ.), M. Myronov (Univ. of Warwick), Yasuhiro Shiraki (Tokyo City Univ.) SDM2011-103		 We have investigated the influence of Si-cap layer and the post deposition annealing (PDA) on compositional depth profil... [more] SDM2011-103
pp.37-41
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