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ICD 2006-04-13
09:20
Oita Oita University The Origin of Variable Retention Time in DRAM -- Fluctuation of Junction Leakage --
Yuki Mori (Hitachi CRL), Kiyonori Ohyu, Kensuke Okonogi (Elpida), Renichi Yamada (Hitachi CRL)
 [more] ICD2006-1
pp.1-6
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