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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]		 2018-12-07
13:45		 Hiroshima Satellite Campus Hiroshima (Hiroshima) A Radiation-hard Low-delay Flip-Flop with Stacking Structure for SOI Process
Mitsunori Ebara, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2018-69 DC2018-55		  [more] VLD2018-69 DC2018-55
pp.203-208
SDM, ICD, ITE-IST [detail] 2018-08-07
11:30		 Hokkaido Hokkaido Univ., Graduate School of IST M Bldg., M151 (Hokkaido) Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process
Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) SDM2018-28 ICD2018-15		 (To be available after the conference date) [more] SDM2018-28 ICD2018-15
pp.15-20
VLD, HWS
(Joint)		 2018-02-28
17:20		 Okinawa Okinawa Seinen Kaikan (Okinawa) Evaluation of a Radiation-Hardened Method and Soft Error Resilience on Stacked Transistors in 28/65 nm FDSOI Processes
Haruki Maruoka, Kodai Yamada, Mitsunori Ebara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2017-103		 The continuous downscaling of transistors has resulted in an increase of reliability issues for semiconductor chips. In ... [more] VLD2017-103
pp.85-90
VLD, HWS
(Joint)		 2018-02-28
17:45		 Okinawa Okinawa Seinen Kaikan (Okinawa) Evaluation of Soft Error Tolerance on Flip-Flop depending on 65 nm FDSOI Transistor Threshold-Voltage
Mitsunori Ebara, Haruki Maruoka, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2017-104		 Moore's Law has been miniaturizing integrated circuits, which
can make a lot of high performance devices such as PCs an... [more]		 VLD2017-104
pp.91-96
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]		 2016-11-28
14:15		 Osaka Ritsumeikan University, Osaka Ibaraki Campus (Osaka) Evaluation of Radiation-Hard Circuit Structures in a FDSOI Process by TCAD Simulations
Kodai Yamada, Haruki Maruoka, Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-49 DC2016-43		 According to the Moore's law, LSIs are miniaturized and the
reliability of LSIs is degraded. To improve the tolerance ... [more]		 VLD2016-49 DC2016-43
pp.31-36
 Results 1 - 5 of 5  /   
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