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Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2015-11-19
Osaka   Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping
Koichi Endo (Toshiba Corp.), Tomonori Nakamura (Hamamatsu Photonics K.K.), Koji Nakamae (Osaka Univ.) R2015-58
We investigate the temperature variation of the top surface image of power metal-oxide semiconductor field effect transi... [more] R2015-58
R 2014-11-20
Osaka   Prediction of performance degradation and lifetime for semiconductor devices using markov chain model
Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) R2014-61
We study on a method to predict performance degradation and lifetime of semiconductor devices under the assumption that ... [more] R2014-61
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