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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2015-11-19
Osaka   Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping
Koichi Endo (Toshiba Corp.), Tomonori Nakamura (Hamamatsu Photonics K.K.), Koji Nakamae (Osaka Univ.) R2015-58
We investigate the temperature variation of the top surface image of power metal-oxide semiconductor field effect transi... [more] R2015-58
R 2014-11-20
Osaka   Prediction of performance degradation and lifetime for semiconductor devices using markov chain model
Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) R2014-61
We study on a method to predict performance degradation and lifetime of semiconductor devices under the assumption that ... [more] R2014-61
R 2011-05-13
Kochi Kochi City Culture-Plaza Cul-Port [Invited Talk] The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations -- Non-electrical-contact fault localization in LSI chips --
Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) R2011-8
 [more] R2011-8
R 2011-05-13
Kochi Kochi City Culture-Plaza Cul-Port Evaluation of defect-tolerance in the quantum-dot cellular automata PLA
Katsuyoshi Miura, Takayuki Notsu, Koji Nakamae (Osaka Univ) R2011-13
At present, there are a number of research efforts that have focused on different devices that might either replace or a... [more] R2011-13
ICD, CPM 2007-01-19
Tokyo Kika-Shinko-Kaikan Bldg. SoC macro-block diagnosis using extracted layout information
Katsuyoshi Miura, Koji Nakamae (Osaka Univ.)
A SoC macro-block diagnostic method using a netlist extracted from layout data is proposed. A hard IP core that does no... [more] CPM2006-147 ICD2006-189
SITE 2006-12-08
Osaka   Engineering Ethics Course for Computer Science Graduate Students
Michio Nakanishi (OIT), Toru Fujiwara (Osaka Univ.), Yoshinori Takeuchi, Masanori Akiyoshi, Masanori Hashimoto, Fumio Kishino, Kiyoshi Kiyokawa, Takahiro Hara, Koji Nakamae, Tohru Kikuno, Yuuichi Teranishi (Osaka University)
 [more] SITE2006-49
ICD, CPM 2005-01-28
Tokyo Kikai-Shinko-Kaikan Bldg. LSI fault diagnosis by using functional test result and netlist extracted from CAD layout data
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka (Osaka Univ.)
 [more] CPM2004-170 ICD2004-215
 Results 1 - 7 of 7  /   
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