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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD, ITE-IST [detail] 2018-08-09
Hokkaido Hokkaido Univ., Graduate School of IST M Bldg., M151 Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) SDM2018-47 ICD2018-34
 [more] SDM2018-47 ICD2018-34
SDM, ICD 2015-08-24
Kumamoto Kumamoto City Area and Performance Study of FinFET with Detailed Parasitic Capacitance Analysis in 16nm Process Node
Takeshi Okagaki, Koji Shibutani, Masao Morimoto, Yasumasa Tsukamoto, Koji Nii, Kazunori Onozawa (REL) SDM2015-64 ICD2015-33
 [more] SDM2015-64 ICD2015-33
ICD, SDM 2014-08-05
Hokkaido Hokkaido Univ., Multimedia Education Bldg. Tr variance evaluation induced by probing pressure and its stress extraction methodology in 28nm High-K and Metal Gate process
Takeshi Okagaki, Takumi Hasegawa, Hiroyuki Takashino, Masako Fujii, Atsushi Tsuda, Koji Shibutani, Yoshinori Deguchi, Miho Yokota, Kazunori Onozawa (Renesas) SDM2014-77 ICD2014-46
 [more] SDM2014-77 ICD2014-46
SDM, ICD 2013-08-02
Ishikawa Kanazawa University A 123uW Standby Power Technique with EM-Tolerant 1.8V I/O NMOS Power Switch in 28nm HKMG Technology
Kazuki Fukuoka, Ryo Mori, Akira Kato, Mitsuhiko Igarashi, Koji Shibutani, Takashi Yamaki, Koji Nii, Sadayuki Morita, Takao Koike (Renesas Electronics), Noriaki Sakamoto (Renesas Mobile) SDM2013-78 ICD2013-60
 [more] SDM2013-78 ICD2013-60
 Results 1 - 4 of 4  /   
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