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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 13:50 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
Low Voltage Operation Boost Converter for ReRAM/NAND Flash Memory Hybrid SSD Kenta Suzuki, Kota Tsurumi, Ken Takeuchi (Chuo Univ.) CPM2017-82 ICD2017-41 IE2017-67 |
[more] |
CPM2017-82 ICD2017-41 IE2017-67 pp.15-20 |
ICD |
2017-04-20 13:50 |
Tokyo |
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[Invited Lecture]
A 1.0 V Operation NAND Flash Memory Program Voltage Generator Fabricated with Standard CMOS Process and NAND Flash Process for IoT Local Devices Kota Tsurumi, Masahiro Tanaka, Ken Takeuchi (Chuo Univ.) ICD2017-5 |
NAND flash memory is considered as candidates for data storage of IoT local devices. The NAND flash memory program volta... [more] |
ICD2017-5 pp.23-28 |
ICD, CPSY |
2016-12-15 15:30 |
Tokyo |
Tokyo Institute of Technology |
[Poster Presentation]
High-Speed Operation of Program Voltage Generator for Low-voltage ReRAM Kenta Suzuki, Masahiro Tanaka, Kota Tsurumi, Ken Takeuchi (Chuo Univ.) ICD2016-67 CPSY2016-73 |
Resistive random access memory (ReRAM) is considered as one of the next generation non-volatile memories due to its high... [more] |
ICD2016-67 CPSY2016-73 p.53 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 14:35 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
ReRAM Write Voltage Generator with Low Supply Voltage Operation and Optimized Comparator Bias-Current Scheme for IoT Edge Device Kota Tsurumi, Masahiro Tanaka, Ken Takeuchi (Chuo Univ.) CPM2016-89 ICD2016-50 IE2016-84 |
Resistive random access memory (ReRAM) is considered as candidates for IoT Edge device because of the high-speed and low... [more] |
CPM2016-89 ICD2016-50 IE2016-84 pp.69-74 |
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