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Committee Date Time Place Paper Title / Authors Abstract Paper #
MW, EMCJ 2010-10-21
16:20		 Akita Akita Univ. Influence of Device Structures on Frequency Spectrum of Common-Mode Current
Kouhei Ohmura, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2010-59 MW2010-94		 When a cryptographic module performs encryption or decryption, secret information which correlate to the intermediate da... [more] EMCJ2010-59 MW2010-94
pp.43-48
EMCJ
(2nd)		 2010-05-27
09:30		 Miyagi Cyberscience Center, Tohoku University Influence of device structure on electromagnetic (EM) information leakage from the device
Kouhei Ohmura, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) 		 [more]
EMCJ, MW, IEE-MAG 2009-10-22
14:00		 Iwate Iwate Univ. The Influence of Attached Lines for Electromagnetic Information Leakage from Information Devices
Kouhei Ohmura, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2009-47 MW2009-96		 Recently, a lot of attack methods which target information leakage via electromagnetic emanation from information device... [more] EMCJ2009-47 MW2009-96
pp.19-24
EMD 2008-11-16
11:40		 Miyagi Tohoku Bunka Gakuin University (Sendai) Pulse Response Characteristic of Connector Contact Failure on a Coaxial Cable
Kouhei Ohmura, Yu-ichi Hayashi, Hideaki Sone (Tohoku Univ.), Jun Fan (Missouri Univ. Sci. Tech.) EMD2008-94		 To evaluate electromagnetic noise interference on transmission line we proposed contact failure model in our previous st... [more] EMD2008-94
pp.117-120
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