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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2020-02-26 10:25 |
Tokyo |
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Defective Chip Prediction Modeling Using Convolutional Neural Networks Ryunosuke Oka, Satoshi Ohtake (Oita Univ.), Kouichi Kumaki (Renesas) DC2019-87 |
In recent years, the cost of LSI testing which guarantees reliability has relatively increased due to the development of... [more] |
DC2019-87 pp.7-12 |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-13 10:55 |
Ehime |
Ehime Prefecture Gender Equality Center |
VLD2019-31 DC2019-55 |
In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] |
VLD2019-31 DC2019-55 pp.13-18 |
DC |
2019-02-27 09:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Variational Autoencoder-Based Efficient Test Escape Detection Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72 |
[more] |
DC2018-72 pp.7-12 |
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