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Committee
Date Time
Place
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Abstract
Paper #
NLP
2006-05-11
12:30
Kumamoto
Kumamoto Univ.
A Study on Test Pattern Generation for LSI Tests Using Chaotic Sequences
Atsushi Izukura
,
Ryusuke Tsuchida
,
Kunihiko Kudou
,
Daisaburo Yoshioka
,
Akio Tsuneda
,
Takahiro Inoue
(
Kumamoto Univ.
)
Linear feedback shift registers (LFSRs) are extensively used in built-in self-test (BIST) as a test pattern generator (T...
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NLP2006-1
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