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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
CS 2019-10-31
Kagoshima Kirishima-Hotel Dependence of elevation mask angle on distance difference between GNSS single positioning and MADOCA positioning
Koki Iwamoto, Hiroshi Fujisaki, Satoshi Takahashi, Koichi Tanaka, Makoto Fujiwara, Naohisa Happo (Hiroshima City Univ.) CS2019-63
 [more] CS2019-63
CS 2019-07-04
Kagoshima Amami City Social Welfare Center A method of LPWA radio transmission of exercise electrocardiography with conductive sports wear hitoe
Hiroshi Fujisaki, Koki Iwamoto, Satoshi Takahashi, Koichi Tanaka, Makoto Fujiwara, Naohisa Happo (Hiroshima City Univ.) CS2019-33
運動トレーニング時においては,運動強度を知るために,しばしば脈拍数が測定される.より詳細な情報を含む心電図や加速度情報をリアルタイムに計測して無線伝送できれば,新しいトレーニング方法が見出される可能性がある.ここでは導電性ウエアhitoeを... [more] CS2019-33
CS, IE, IPSJ-AVM, ITE-BCT [detail] 2018-11-29
Tokushima Tokushima University (Memorial Hall of Almuni(Engineering)) Capture effect between LPWA systems with different modulation
Satoshi Takahashi, Koichi Tanaka, Makoto Fujiwara, Naohisa Happo (Hiroshima City Univ.)
OME, OPE 2010-11-12
Tokyo Kikai-Shinko-Kaikan Bldg. Flexible Optical/Electrical PWB module
Makoto Fujiwara (SB) OME2010-59 OPE2010-129
(To be available after the conference date) [more] OME2010-59 OPE2010-129
MBE 2010-07-09
Okayama Okayama University The estimate of the brain function change using neural network
Makoto Fujiwara, Masatake Akutagawa, Yohsuke Kinouchi, Hirofumi Nagashino, Takahiro Emoto (Univ. of Tokushima) MBE2010-18
As means to know the function of the brain, technique to observe brain waves (EEG) is used mainly by the cheap sheath co... [more] MBE2010-18
SDM, VLD 2007-10-30
Tokyo Kikai-Shinko-Kaikan Bldg. Study of Parasitic Resistance Behavior and Its Extraction Method on Deeply Scaled MOSFETs
Hideji Tsujii, Akira Hokazono, Makoto Fujiwara, Shigeru Kawanaka, Atsushi Azuma, Nobutoshi Aoki, Yoshiaki Toyoshima (Toshiba) VLD2007-56 SDM2007-200
 [more] VLD2007-56 SDM2007-200
ICD, SDM 2005-08-19
Hokkaido HAKODATE KOKUSAI HOTEL Robust Device Design in FinFET SRAM for hp22nm Technology Node
Kimitoshi Okano, Tatsuya Ishida, Takahiko Sasaki, Takashi Izumida, Masaki Kondo, Makoto Fujiwara, Nobutoshi Aoki, Satoshi Inaba, Nobuaki Otsuka, Kazunari Ishimaru, Hidemi Ishiuchi (Toshiba)
Feasibility of FinFET SRAM operation at hp22nm technology node has been studied by device and circuit simulation from th... [more] SDM2005-154 ICD2005-93
 Results 1 - 7 of 7  /   
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