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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-30
10:05
Miyazaki NewWelCity Miyazaki Capture power reduction in multi-cycle test structure
Hisato Yamaguchi, Makoto Matsuzono, Kohei Miyase, Yasuo Sato, Seiji Kajihara (KIT) VLD2011-83 DC2011-59
Power consumption during Built-In Self-Test(BIST) is far larger than that of normal operation. Therefore, it may lead to... [more] VLD2011-83 DC2011-59
pp.179-183
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2010-11-29
15:25
Fukuoka Kyushu University Evaluation of Multi-Cycle Test with Partial Observation in Scan BIST Structure
Hisato Yamaguchi, Makoto Matsuzono, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech./JST) VLD2010-61 DC2010-28
Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for th... [more] VLD2010-61 DC2010-28
pp.31-36
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