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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:05 |
Miyazaki |
NewWelCity Miyazaki |
Capture power reduction in multi-cycle test structure Hisato Yamaguchi, Makoto Matsuzono, Kohei Miyase, Yasuo Sato, Seiji Kajihara (KIT) VLD2011-83 DC2011-59 |
Power consumption during Built-In Self-Test(BIST) is far larger than that of normal operation. Therefore, it may lead to... [more] |
VLD2011-83 DC2011-59 pp.179-183 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 15:25 |
Fukuoka |
Kyushu University |
Evaluation of Multi-Cycle Test with Partial Observation in Scan BIST Structure Hisato Yamaguchi, Makoto Matsuzono, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech./JST) VLD2010-61 DC2010-28 |
Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for th... [more] |
VLD2010-61 DC2010-28 pp.31-36 |
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