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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 153  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS 2024-04-19
16:25
Tokyo   Non-Destructive Hardware Trojan Inspection by Backside Near Infrared Imaging
Junichi Sakamoto, Yohei Hori, Shinichi Kawamura (AIST), Yuichi Hayashi (NAIST), Makoto Nagata (KU)
 [more]
HWS 2024-04-19
16:50
Tokyo   Supply chain risk and hardware trojan protection
Shinichi Kawamura, Tsutomu Matsumoto, Hirotaka Yoshida (AIST), Yasuyoshi Uemura (SCU), Makoto Nagata (Kobe Univ.), Makoto Ikeda (Tokyo Univ.), Ken Takano (LINTEC)
 [more]
HWS 2024-04-19
17:15
Tokyo   Supply chain security of semiconductor chips and countermeasure design technologies
Makoto Nagata (Kobe Univ.), Kazuki Monta (Secafy Co., Ltd.), Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.)
 [more]
VLD, HWS, ICD 2024-02-29
12:05
Okinawa
(Primary: On-site, Secondary: Online)

Shuhei Yokota, Rikuu Hasegawa, Kazuki Monta, Takaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univercity) VLD2023-112 HWS2023-72 ICD2023-101
With the rapid development of electronic technology, the level of integration of electronic devices is clearly on the ri... [more] VLD2023-112 HWS2023-72 ICD2023-101
pp.77-82
VLD, HWS, ICD 2024-03-01
11:15
Okinawa
(Primary: On-site, Secondary: Online)
Investigation of electromagnetic irradiation noise reduction by on-chip LDOs
Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-124 HWS2023-84 ICD2023-113
IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions (faults) by injecting il... [more] VLD2023-124 HWS2023-84 ICD2023-113
pp.131-134
SDM 2024-02-21
11:25
Tokyo Tokyo University-Hongo-Engineering Bldg.4
(Primary: On-site, Secondary: Online)
[Invited Talk] Development of Backside Buried Metal Layer Technology to Enhance Power Integrity of Three-Dimensional Integrated Circuits
Naoya Watanabe, Yuuki Araga, Haruo Shimamoto (AIST), Makoto Nagata (Kobe Univ.), Katsuya Kikuchi (AIST) SDM2023-83
 [more] SDM2023-83
pp.9-15
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-17
09:35
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Backside Side-Channel Attack by Silicon Substrate Voltage and Simulation
Rikuu Hasegawa, Kazuki Monta, Takuya Watatsumi, Takuji Miki, Makoto Nagata (Kobe Univ) VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66
Integrated circuit (IC) chips equipped with cryptographic circuits are vulnerable to side-channel attacks, which use exp... [more] VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66
pp.173-177
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-17
10:00
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Derivation of secret keys by differential fault analysis using backside voltage fault injection
Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67
Lasers have been the leading method of fault injection in fault injection attacks on cryptographic integrated circuit (I... [more] VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67
pp.178-181
ICD, HWS 2023-10-31
15:00
Mie  
(Primary: On-site, Secondary: Online)
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking
Kazuki Monta, Rikuu Hasegawa, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-57 ICD2023-36
2.5D and 3D packaging are methodologies that include multiple integrated circuit (IC) chips. They deliver enhanced perfo... [more] HWS2023-57 ICD2023-36
pp.16-19
MW, EMCJ, EST, IEE-EMC [detail] 2023-10-20
10:50
Yamagata Yamagata University
(Primary: On-site, Secondary: Online)
Response Analysis of 5G Receiver Sensitivity to Electromagnetic Noise Components in Industrial Drones
Koh Watanabe (NICT), Ryota Sakai, Hiraku Uehara, Satoshi Tanaka, Makoto Nagata (Kobe Univ.), Yasushi Matsumoto, Kaoru Gotoh (NICT) EMCJ2023-53 MW2023-107 EST2023-80
(To be available after the conference date) [more] EMCJ2023-53 MW2023-107 EST2023-80
pp.94-97
SDM, ICD, ITE-IST [detail] 2023-08-01
10:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
A research on a cryogenic ADC for acquisition of environmental noise near quantum devices.
Tomoya Yamada, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2023-36 ICD2023-15
Scaling up the number of qubits is essential to realize a fault-tolerant quantum computer. However, as the number of qub... [more] SDM2023-36 ICD2023-15
pp.6-9
SDM, ICD, ITE-IST [detail] 2023-08-01
11:10
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Evaluation on Flip-Chip Packaging for Quantum Computers at Cryogenic Temperature
Misato Taguchi, Ryozo Takahashi (Kobe Univ.), Masako Kato, Nobuhiro Kusuno (Hitachi, Ltd), Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2023-37 ICD2023-16
Quantum Computers are the most promising technologies to archive more complex calculations. At the same time, much large... [more] SDM2023-37 ICD2023-16
pp.10-13
EMCJ 2023-06-09
14:05
Hokkaido Otaru Chamber of Commerce & Industry
(Primary: On-site, Secondary: Online)
Evaluation of Electromagnetic Interference with GPS Module by Electromagnetic Noise nearby Industrial Drones
Hiraku Uehara (Kobe Univ), Koh Watanabe (NICT), Ryota Sakai, Sosuke Ashida, Satoshi Tanaka, Makoto Nagata (Kobe Univ) EMCJ2023-22
 [more] EMCJ2023-22
pp.54-57
EMCJ 2023-06-09
14:25
Hokkaido Otaru Chamber of Commerce & Industry
(Primary: On-site, Secondary: Online)
Evaluation and Countermeasure for Electromagnetic Interference with Mobile Communication Systems inside Industrial Drones
Ryota Sakai (Kobe Univ.), Koh Watanabe (NICT), Sosuke Ashida, Hiraku Uehara, Satoshi Tanaka, Makoto Nagata (Kobe Univ.), Hideki Osaka (toriR Lab.), Atsushi Nakamura (UTI) EMCJ2023-23
 [more] EMCJ2023-23
pp.58-61
EMCJ 2023-06-09
14:45
Hokkaido Otaru Chamber of Commerce & Industry
(Primary: On-site, Secondary: Online)
Study of Electromagnetic Noise Evaluation with High-Order Harmonics from Switching Semiconductor Chips
Sosuke Ashida (Kobe Univ.), Koh Watanabe (NICT), Ryota Sakai, Hiraku Uehara, Makoto Nagata, Satoshi Tanaka (Kobe Univ.), Masahiro Yamaguchi (Tohoku Univ) EMCJ2023-24
 [more] EMCJ2023-24
pp.62-65
HWS 2023-04-14
13:20
Oita
(Primary: On-site, Secondary: Online)
Exploration of hardware Trojan detection through power supply current simulation
Takafumi Oki, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-1
The recent development of information and communication technology has increased the demand for integrated circuit (IC) ... [more] HWS2023-1
pp.1-5
HWS 2023-04-14
14:45
Oita
(Primary: On-site, Secondary: Online)
Exploration of analysis methods of electromagnetic fault injection attacks on cryptographic IC chips
Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-4
There are various methods of fault injection attacks on cryptographic IC chips, such as lasers and electromagnetic waves... [more] HWS2023-4
pp.11-15
HWS 2023-04-14
15:10
Oita
(Primary: On-site, Secondary: Online)
Electromagnetic fault injection attacks on cryptographic IC chips and analysis of internal voltage fluctuation
Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ) HWS2023-5
Cryptographic IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions through in... [more] HWS2023-5
pp.16-19
HWS 2023-04-15
09:15
Oita
(Primary: On-site, Secondary: Online)
An AES Cryptographic Processor with Partial Re-Keying Scheme Utilizing Physical Attack Sensor
Ryuki Ikemoto, Soichiro Fujii (Osaka Univ.), Yuki Yamashita, Makoto Nagata (Kobe Univ.), Jun Shiomi, Yoshihiro Midoh, Noriyuki Miura (Osaka Univ.) HWS2023-9
We propose a partial secret key update method for AES cryptography using sensors that can detect physical attacks on cry... [more] HWS2023-9
pp.34-36
HWS 2023-04-15
11:10
Oita
(Primary: On-site, Secondary: Online)
Simultaneous Measured Data and Device Authentication Utilizing Unique Sensor PUF Characteristics
Kosuke Kawamura (Osaka Univ.), Yasuhiro Kubota, Makoto Nagata (Kobe Univ.), Jun Shiomi, Yoshihiro Midoh, Noriyuki Miura (Osaka Univ.) HWS2023-13
 [more] HWS2023-13
pp.51-53
 Results 1 - 20 of 153  /  [Next]  
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