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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IT, ISEC, WBS |
2007-03-15
10:20 |
Gunma |
Gunma Univ. (Kiryu Campus) |
On the Study of the Effect of Variable Parameter in Pseudo Random Number Generation using 1-Dimensional Linear Mapping
Takashi Iwano, Manabu Kaneda, Hidetoshi Okutomi (Toshiba Information Systems) |
This paper reports additional research on randomness performance of the pseudo-random number generation method using non... [more] |
IT2006-68 ISEC2006-123 WBS2006-65
pp.47-51 |
| IT, ISEC, WBS |
2007-03-15
10:45 |
Gunma |
Gunma Univ. (Kiryu Campus) |
A Study on Discrete Fourier Transform Test Included in NIST Randomness Test Suite
Manabu Kaneda, Hidetoshi Okutomi (Toshiba Information Systems), Katsuhiro Nakamura (Chiba Univ.) |
We evaluated test method of Discrete Fourier Transform Test included in NIST randomness test. We suggested our evaluatio... [more] |
IT2006-69 ISEC2006-124 WBS2006-66
pp.53-58 |
| WBS, IT, ISEC |
2006-03-17
15:25 |
Aichi |
Nagoya Univ. |
On the Randomness Evaluation Method Using NIST Randomness Test
Hidetoshi Okutomi, Manabu Kaneda (TOSHIBA INFORMATION SYSTEMS), Kenji Yamaguchi, Katsuhiro Nakamura (Chiba Univ.) |
NIST randomness test is widely used today as statistical evaluation method of the randomness. In this paper, at first, w... [more] |
IT2005-108 ISEC2005-165 WBS2005-122
pp.79-84 |
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