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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| SDM |
2006-06-22
10:55 |
Hiroshima |
Faculty Club, Hiroshima Univ. |
Realization of SiON films with small ΔVfb
Daisuke Matsushita, Koichi Muraoka, Yasushi Nakasaki, Koichi Kato, Shoko Kikuchi, Kiwamu Sakuma, Yuichiro Mitani (toshiba R&D center), Mariko Takayanagi, Kazuhiro Eguchi (Semiconductor Company) |
[more] |
SDM2006-56
pp.81-86 |
| ICD, SDM |
2005-08-19
10:45 |
Hokkaido |
HAKODATE KOKUSAI HOTEL |
HfSiON Gate Dielectrics Design for Mixed Signal CMOS
Kenji Kojima, Ryosuke Iijima, Tatsuya Ohguro, Takeshi Watanabe, Mariko Takayanagi, Hisayo S. Momose, Kazunari Ishimaru, Hidemi Ishiuchi (TOSHIBA) |
(Advance abstract in Japanese is available) [more] |
SDM2005-147 ICD2005-86
pp.25-30 |
| ICD, SDM |
2005-08-19
15:15 |
Hokkaido |
HAKODATE KOKUSAI HOTEL |
High-k; Last Card for the Leakage Currents
Tadayoshi Enomoto (Chuo Univ.), Mariko Takayanagi (Toshiba), Shigeo Satoh (Fujitu), Koji Nii (Renesas), Akira Nishiyama (Toshiba), ハセ タカシ (NEC), Mototsugu Hamada (Toshiba), Jiro Yugami (Renesas) |
(Advance abstract in Japanese is available) [more] |
SDM2005-155 ICD2005-94
pp.73-78 |
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