Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMD |
2012-01-20 13:35 |
Kanagawa |
|
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- Contact Resistance and its model (20) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2011-112 pp.1-6 |
EMD |
2011-12-16 13:55 |
Tokyo |
NIT Kanda Camps |
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- Contact Resistance and its model (19) -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-108 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2011-108 pp.11-16 |
EMD |
2011-11-18 16:15 |
Akita |
Akita Univ. Tegata Campus |
Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism
-- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102 |
Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more] |
EMD2011-102 pp.189-194 |
EMD |
2011-10-21 12:35 |
Tokyo |
Tachikawa-Shiminn-kaikan |
Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism
-- Contact Resistance (17) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2011-57 pp.1-6 |
EMD, EMCJ |
2011-07-15 12:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism
-- Contact resistance (16) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2011-61 EMD2011-20 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMCJ2011-61 EMD2011-20 pp.1-6 |
EMD, EMCJ |
2011-07-15 12:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts by a Tapping Device
-- A tapping device for trial (3) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Koki Takeda, Daiki Ishizuka, Kunio Yanagi, Hiroaki Kubota (TMC), Nobuhiro Kuga (YNU), Koichiro Sawa (NIT) EMCJ2011-62 EMD2011-21 |
Authors have developed and made a handy “tapping device (TPD)” experimentally without a special stage for the inspection... [more] |
EMCJ2011-62 EMD2011-21 pp.7-12 |
EMD |
2011-05-20 15:50 |
Miyagi |
Tohoku Univ. Cyber-Science Center |
Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- Contact resistance -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-7 |
Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] |
EMD2011-7 pp.33-38 |
NLP |
2011-03-11 16:35 |
Tokyo |
Tokyo University of Science |
A Study of Degradatuion Phenomenon of electrical Contacts by some Oscillating Mechanisms
-- Modeling about Fluctuation of Contact Resistance -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Tohru Ikeguchi (Saitama Univ.), Yoshihiko Horio (Tokyo Denki Univ.), Koichiro Sawa (Nippon Insti. of Tech.) NLP2010-196 |
The authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences o... [more] |
NLP2010-196 pp.187-192 |
EMD |
2011-01-28 15:40 |
Tokyo |
Japan Aviation Electronics Industry,Limited |
Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (1) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-141 |
Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering osci... [more] |
EMD2010-141 pp.35-40 |
EMD |
2011-01-28 16:05 |
Tokyo |
Japan Aviation Electronics Industry,Limited |
Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (2) -- Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-142 |
Authors have developed and made a handy "tapping device (TPD)" experimentally without a special stage for the inspection... [more] |
EMD2010-142 pp.41-46 |
EMD |
2010-12-17 14:30 |
Tokyo |
Tamagawa University |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Contact Resistance (14) -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) EMD2010-132 |
Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] |
EMD2010-132 pp.17-22 |
IN |
2010-02-05 13:30 |
Okinawa |
|
Class-based call-blocking curve to simulate SMDP optimum admission control based on characteristic analysis Masahiro Kawano, Sumiko Miyata, Katsunori Yamaoka (Tokyo Inst. of Tech.) IN2009-140 |
Recently, multimedia applications such as video and audio are popular. Then, various kinds of heterogeneous stream flows... [more] |
IN2009-140 pp.81-86 |
IN, NS (Joint) |
2009-03-04 13:30 |
Okinawa |
Okinawa-Zanpamisaki Royal Hotel |
SVM admission control reproducing SMDP optimum admission control based on equality of flow class Masahiro Kawano, Sumiko Shirata, Katsunori Yamaoka (Tokyo Inst. of Tech.) IN2008-207 |
Recently, multimedia applications such as video and audio are popular. Then, various kinds of heterogeneous stream flows... [more] |
IN2008-207 pp.445-450 |