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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2008-10-10
16:45		 Miyagi Tohoku Univ. The data analysis and measurement technique of the atomic force microscopy for the atomically flat silicon surface
Masahiro Konda, Akinobu Teramoto, Tomoyuki Suwa, Rihito Kuroda, Tadahiro Ohmi (Tohoku Univ) SDM2008-168		 (To be available after the conference date) [more] SDM2008-168
pp.75-78
SDM, ED 2008-07-11
12:20		 Hokkaido Kaderu２・７ The Data Analysis Technique of the Atomic Force Microscopy for the Atomically Flat Silicon Surface
Masahiro Konda, Akinobu Teramoto, Tomoyuki Suwa, Rihito Kuroda, Tadahiro Ohmi (Tohoku Univ.) ED2008-89 SDM2008-108		 Atomically flat (100) silicon surface constructed with atomic terraces and steps is realized by argon annealing at 1200℃... [more] ED2008-89 SDM2008-108
pp.265-269
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