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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ITS, IE, ITE-MMS, ITE-ME, ITE-AIT [detail] | 2024-02-19 15:15 |
Hokkaido | Hokkaido Univ. (Hokkaido) | A prototype study on External Human Machine Interface (HMI) for automated bus
-- Virtual Reality (VR) reproduction of real experiment environment -- Sota Suzuki (AIST/TUS), Yanbin Wu, Kumagai Toru, Masaki Masuda, Koya Takahashi, Naohisa Hashimoto (AIST), Satoru Ogino (AIST/TUS), Makoto Itami (TUS)  ITS2023-58 IE2023-47 |
[more] | ITS2023-58 IE2023-47 pp.68-71 |
| ITS, WBS, RCC | 2023-12-22 11:20 |
Okinawa | (Okinawa, Online) (Primary: On-site, Secondary: Online) |
Study on intention display by external HMI in automated vehicles Hiromu Saito, Jeyeon Kim (NITTC), Yanbin Wu, Masaki Masuda, Toru Kumagai, Naohisa Hashimoto (AIST) WBS2023-54 ITS2023-37 RCC2023-48 |
In recent years, the introduction of automated vehicles has been considered as a solution to problems such as impact of ... [more] | WBS2023-54 ITS2023-37 RCC2023-48 pp.134-137 |
| ICD, CPSY | 2015-12-18 09:00 |
Kyoto | Kyoto Institute of Technology (Kyoto) | Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes. Eiji Sonezaki, Kubota Kanto, Masaki Masuda, Shohei Kanda, Jun Furuta, Kazutoshi Kobayashi (KIT) ICD2015-83 CPSY2015-96 |
According to process down scaling, LSI becomes less reliable for soft errors. To increase the tolerance of FFs for soft ... [more] | ICD2015-83 CPSY2015-96 pp.69-74 |
| VLD | 2013-03-06 15:35 |
Okinawa | Okinawa Seinen Kaikan (Okinawa) | Robust Redundant Circuit Structure to Mitigate Wearout by Reversing Register Values Shogo Okada, Masaki Masuda (Kyoto Inst. of Tech.), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2012-162 |
[more] | VLD2012-162 pp.147-152 |
| ICD | 2012-12-18 11:45 |
Tokyo | Tokyo Tech Front (Tokyo) | A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117 |
We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] | ICD2012-117 pp.109-113 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-26 16:25 |
Fukuoka | Centennial Hall Kyushu University School of Medicine (Fukuoka) | A Low-Power and Area-Efficient Radiation-Hard Redundant Flip-Flop
-- DICE ACFF -- Kanto Kubota, Masaki Masuda, Kazutoshi Kobayashi (KIT) VLD2012-71 DC2012-37 |
[more] | VLD2012-71 DC2012-37 pp.69-74 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-28 13:25 |
Miyazaki | NewWelCity Miyazaki (Miyazaki) | Performance Evaluation of Soft-Error Tolerant Multiple Modular Processors Implemented with Redundant and Non-Redundant Flip-Flops Shogo Okada, Masaki Masuda (KIT), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (KIT) VLD2011-59 DC2011-35 |
Soft-error rates are becoming larger due to process scaling. Various ways of prediction for soft-error are being tried.... [more] |
VLD2011-59 DC2011-35 pp.43-48 |
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