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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2008-12-12
16:35
Tokyo Tokyo Inst. Tech., Ohokayama Campus, Kokusa-Kouryu-Kaikan Post-Silicon Programmed Body-Biasing Platform Suppressing Device Variability in 45 nm CMOS Technology
Issei Kashima, Hiroaki Suzuki, Masanori Kurimoto (Renesas Technology Corp), Tadao Yamanaka (Renesas Design), Hidehiro Takata (Renesas Technology Corp), Hiroshi Makino (Osaka Institute of Tech), Hirofumi Shinohara (Renesas Technology Corp) ICD2008-128
The Post-Silicon Programmed Body-Biasing Platform is proposed to suppress device variability in the 45-nm CMOS technolog... [more] ICD2008-128
pp.137-142
VLD 2008-09-29
13:30
Ishikawa   [Invited Talk] Phase-Adjustable Error Detection Flip-Flops with 2-Stage Hold Driven Optimization and Slack Based Grouping Scheme for Dynamic Voltage Scaling
Masanori Kurimoto, Hiroaki Suzuki (Renesas Technology), Rei Akiyama, Tadao Yamanaka, Haruyuki Okuma (Renesas Design), Hidehiro Takata, Hirofumi Shinohara (Renesas Technology) VLD2008-47
 [more] VLD2008-47
pp.1-6
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