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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2019-12-20 16:30 |
Wakayama |
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Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] |
DC2019-85 pp.37-42 |
DC |
2011-02-14 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60 |
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This h... [more] |
DC2010-60 pp.7-12 |
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