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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD 2016-03-01
11:45
Okinawa Okinawa Seinen Kaikan In-situ Hardware-Trojan Authentication for Invalidating Malicious Functions
Masaru Oya, Youhua Shi, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2015-124
 [more] VLD2015-124
pp.79-84
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2015-12-03
10:10
Nagasaki Nagasaki Kinro Fukushi Kaikan A Quantitative Criterion of Gate-Level Netlist Vulnerability
Masaru Oya, Youhua Shi (Waseda Univ.), Noritaka Yamashita, Toshihiko Okamura, Yukiyasu Tsunoo (NEC), Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2015-59 DC2015-55
Recently, digital ICs are designed by outside vendors to reduce costs in semiconductor industry.
This circumstance intr... [more]
VLD2015-59 DC2015-55
pp.141-146
VLD 2015-03-04
13:25
Okinawa Okinawa Seinen Kaikan A Score-Based Hardware-Trojan Identification Method for Gate-Level Netlists
Masaru Oya, Youhua Shi, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2014-182
Recently, digital ICs are designed by outside vendors to reduce costs
in semiconductor industry. This circumstance intr... [more]
VLD2014-182
pp.165-170
RECONF, CPSY, VLD, IPSJ-SLDM [detail] 2015-01-30
10:50
Kanagawa Hiyoshi Campus, Keio University A Hardware Trojan Detection Method based on Trojan net features
Masaru Oya, Youhua Shi, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2014-137 CPSY2014-146 RECONF2014-70
Recently, digital ICs are designed by outside vendors to reduce costs
in semiconductor industry. This circumstance intr... [more]
VLD2014-137 CPSY2014-146 RECONF2014-70
pp.157-162
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2014-11-26
17:30
Oita B-ConPlaza A Hardware Trojans Detection Method focusing on Nets in Hardware Trojans in Gate-Level Netlists
Masaru Oya, Youhua Shi, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2014-91 DC2014-45
Recently, digital ICs are designed by outside vendors to reduce design costs in semiconductor industry.
This circumstan... [more]
VLD2014-91 DC2014-45
pp.135-140
VLD 2014-03-03
16:25
Okinawa Okinawa Seinen Kaikan Secure scan design using improved random order scans and its evaluations
Masaru Oya, Yuta Atobe, Youhua Shi, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2013-141
Scan test using scan chains is one of the most important DFT techniques.
On the other hand, scan-based attacks are repo... [more]
VLD2013-141
pp.43-48
US 2008-06-20
16:10
Chiba Chiba Univ. Verification of the relation between the tissue effect and the oscillating distribution of an ultrasonically activated scalpel
Masaru Oya, Tadashi Yamaguchi, Hideki Hayashi (Chiba Univ.), Hiroyuki Hachiya (Tokyo Inst. Tech.) US2008-21
Ultrasonically activated scalpel is used widely in laparoscope-assisted surgery, but it is concerned that it may damage ... [more] US2008-21
pp.31-36
 Results 1 - 7 of 7  /   
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