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All Technical Committee Conferences (Searched in: Recent 10 Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC, CPSY, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2025-03-18 09:40 |
Kagoshima | Okierabu Floral Hotel (Primary: On-site, Secondary: Online) |
 CPSY2024-52 DC2024-123 |
[more] | CPSY2024-52 DC2024-123 pp.43-48 |
| DC | 2025-02-18 14:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | DC2024-111 |
(To be available after the conference date) [more] | DC2024-111 pp.31-36 |
| DC | 2024-12-06 14:00 |
Oita | Southern Cross Community Square | A Multiple Target Seed Generation Method for Random Pattern Resistant Faults Using k-Time Expansion Models Takanobu Sone, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) DC2024-98 |
In recent years, with high density of very large-scale integrated circuits (VLSIs), it has become impractical to store a... [more] | DC2024-98 pp.1-6 |
| CPSY, DC, RECONF, IPSJ-ARC [detail] | 2024-08-08 09:25 |
Tokushima | Awagin Hall (Primary: On-site, Secondary: Online) |
Tomoya Aoyama (Tokyo Metro. Univ.), Moe Sugiyama, Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metro. Univ.) CPSY2024-16 DC2024-16 RECONF2024-16 |
[more] | CPSY2024-16 DC2024-16 RECONF2024-16 pp.1-4 |
| CPSY, DC, RECONF, IPSJ-ARC [detail] | 2024-08-08 16:45 |
Tokushima | Awagin Hall (Primary: On-site, Secondary: Online) |
X-Filling and Test Scheduling Methods for Concurrent Testing Using Optimistically/Pessimistically Structural Symbolic Simulation Haruta Tokuta, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2024-25 DC2024-25 RECONF2024-25 |
In recent years, with the increasing test cost of VLSIs, it has become important to reduce the number of test patterns. ... [more] | CPSY2024-25 DC2024-25 RECONF2024-25 pp.46-51 |
| DC, CPSY, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2024-03-22 15:20 |
Nagasaki | Ikinoshima Hall (Primary: On-site, Secondary: Online) |
CPSY2023-46 DC2023-112 |
(To be available after the conference date) [more] | CPSY2023-46 DC2023-112 pp.47-52 |
| DC | 2024-02-28 14:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Low Power Oriented Multiple Target Test Generation Method for 2 Cycle Gate-Exhaustive Faults Using Pseudo Boolean Optimization Momona Mizota, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyou Uni), Masayuki Arai (Nihon Univ) DC2023-99 |
[more] | DC2023-99 pp.29-34 |
| DC | 2024-02-28 14:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | DC2023-100 |
[more] | DC2023-100 pp.35-40 |
| DC | 2023-12-08 13:30 |
Nagasaki | ARKAS SASEBO (Primary: On-site, Secondary: Online) |
DC2023-87 |
(To be available after the conference date) [more] | DC2023-87 pp.1-6 |
| DC | 2023-12-08 13:50 |
Nagasaki | ARKAS SASEBO (Primary: On-site, Secondary: Online) |
A Multiple Target Seed Generation Method for Random Pattern Resistant Faults Using a Compatible Fault Set on Built-in Self Test Takanobu Sone, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) DC2023-88 |
In recent years, with high density of very large-scale integrated circuits, it has become impractical to store a large n... [more] | DC2023-88 pp.7-12 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-16 17:10 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Takumi Sugioka, Yosikazu Nagamura (Tokyo Metoropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metoropolitan Univ.) VLD2023-62 ICD2023-70 DC2023-69 RECONF2023-65 |
(To be available after the conference date) [more] | VLD2023-62 ICD2023-70 DC2023-69 RECONF2023-65 pp.168-172 |
| CPSY, DC, IPSJ-ARC [detail] | 2023-08-04 14:30 |
Hokkaido | Hakodate Arena (Primary: On-site, Secondary: Online) |
CPSY2023-21 DC2023-21 |
[more] | CPSY2023-21 DC2023-21 pp.78-82 |
| DC, CPSY, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2023-03-23 16:25 |
Kagoshima | Amagi Town Disaster Prevention Center (Tokunoshima) (Primary: On-site, Secondary: Online) |
Yuki Yamanaka, Yoshikazu Nagamura (Tokyo Metro. Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metro. Univ.) CPSY2022-41 DC2022-100 |
[more] | CPSY2022-41 DC2022-100 pp.43-48 |
| DC | 2023-02-28 11:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Takumi Sugioka, Yoshikazu Nagamura (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2022-82 |
[more] | DC2022-82 pp.1-5 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-10-12 10:00 |
Niigata | Yuzawa Toei Hotel (Primary: On-site, Secondary: Online) |
A Study on Hi-Resolution Wafer Map Defect Pattern Classification Using CapsNet Yuki Yamanaka, Yoshikazu Nagamura (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Hukumoto (Tokyo Metropolitan Univ.) CPSY2022-22 DC2022-22 |
[more] | CPSY2022-22 DC2022-22 pp.26-30 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 10:15 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
On the Acceleration of a Low Power Oriented Test Generation Method Using Fault Excitation Conditions Rei Miura, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) CPSY2022-2 DC2022-2 |
[more] | CPSY2022-2 DC2022-2 pp.7-12 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:10 |
Online | Online | * Hiroki Kawaguchi, Itsuki Fujita, Yoshikazu Nagamura (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metropolitan Univ.) CPSY2021-55 DC2021-89 |
(To be available after the conference date) [more] | CPSY2021-55 DC2021-89 pp.61-66 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:30 |
Online | Online | A Don't Care Filling Method of Control Signals for Concurrent Logical Fault Testing Haofeng Xu, Toshinori Hosokawa, Hiroshi Yamazaki, Masayuki Arai (Nihon Univ), Masayoshi Yoshimura (KSU) CPSY2021-56 DC2021-90 |
In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. ... [more] | CPSY2021-56 DC2021-90 pp.67-72 |
| DC | 2022-03-01 16:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
An Estimation Method of Defect Types for Multi-cycle Capture Testing Using Artificial Neural Networks and Fault Detection Information Natsuki Ota, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.), Masayuki Arai, Yukari Yamauchi (Nihon Univ.) DC2021-77 |
[more] | DC2021-77 pp.75-80 |
| DC | 2022-03-01 16:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
DC2021-78 |
[more] | DC2021-78 pp.81-86 |
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