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All Technical Committee Conferences (Searched in: Recent 10 Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2017-06-20 16:30 |
Tokyo |
Campus Innovation Center Tokyo (Tokyo) |
Characterization of defects in Ge1-xSnx gate stack structure Yuichi Kaneda, Shinnichi ike, Masayuki Kanematsu, Mitsuo Sakashita, Wakana Takeuchi, Osamu Nakatsuka, Shigeaki Zaima (Nagoya Univ.) SDM2017-29 |
(To be available after the conference date) [more] |
SDM2017-29 pp.39-42 |
SDM |
2016-06-29 13:50 |
Tokyo |
Campus Innovation Center Tokyo (Tokyo) |
Characterization of electrically active defects in epitaxial GeSn layer grown on Ge substrate Yuichi Kaneda, Masayuki Kanematsu, Mitsuo Sakashita, Wakana Takeuchi, Osamu Nakatsuka, Shigeaki Zaima (Nagoya Univ.) SDM2016-39 |
[more] |
SDM2016-39 pp.37-41 |
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