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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ED, CPM |
2013-05-17 11:45 |
Shizuoka |
Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. |
Electron-tunneling operation of single-dopant-atom transistors at elevated temperature
-- Toward room temperature operation -- Daniel Moraru, Earfan Hamid, Arup Samanta (Shizuoka Univ.), Le The Anh (JAIST), Takeshi Mizuno (Shizuoka Univ.), Hiroshi Mizuta (JAIST/Southampton Univ.), Michiharu Tabe (Shizuoka Univ.) ED2013-28 CPM2013-13 SDM2013-35 |
[more] |
ED2013-28 CPM2013-13 SDM2013-35 pp.65-70 |
SDM, ED |
2013-02-27 15:40 |
Hokkaido |
Hokkaido Univ. |
Individual Dopant Nature in Si Lateral Nano-pn Junctions Sri Purwiyanti, Arief Udhiarto (Shizuoka Univ./Univ. Indonesia), Roland Nowak (Shizuoka Univ./Warsaw Univ. of Tech.), Daniel Moraru, Takeshi Mizuno (Shizuoka Univ.), Djoko Hartanto (Univ. Indonesia), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2012-132 SDM2012-161 |
In this work, we report the experimental observation of dopant signature in nanoscale ultra-thin SOI pn junctions. At te... [more] |
ED2012-132 SDM2012-161 pp.25-30 |
ED, SDM |
2012-02-07 14:10 |
Hokkaido |
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Ab initio Analysis of Electronic States for Single Phosphorus Dopants in Silicon Nanorod Transistors Youhei Kuzuya, Daniel Moraru, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.), Hiroshi Mizuta (JAIST/Univ. of Southampton) ED2011-143 SDM2011-160 |
Dopant-induced fluctuation of MOSFET characteristics along with device miniaturization has been recognized as a serious ... [more] |
ED2011-143 SDM2011-160 pp.7-11 |
ED, SDM |
2012-02-07 14:35 |
Hokkaido |
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KFM observation of individual dopant potentials and electron charging Roland Nowak, Miftahul Anwar, Daniel Moraru, Takeshi Mizuno (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2011-144 SDM2011-161 |
We utilize Kelvin probe force microscope (KFM) to measure surface potential of thin channel of nanoscale field effect tr... [more] |
ED2011-144 SDM2011-161 pp.13-18 |
SDM, ED |
2011-02-24 10:20 |
Hokkaido |
Hokkaido Univ. |
Single-Electron Transfer between Two Donors in Thin Nanoscale Silicon Transistors Daniel Moraru, Earfan Hamid, Juli Cha Tarido, Sakito Miki, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-202 SDM2010-237 |
[more] |
ED2010-202 SDM2010-237 pp.57-62 |
SDM, ED |
2011-02-24 11:10 |
Hokkaido |
Hokkaido Univ. |
Current Intermittency in SOI-FETs under Light Illumination Arief Udhiarto, Daniel Moraru, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-204 SDM2010-239 |
We investigate the effects of continuous light illumination on single-electron transport via quantum dots in silicon-on-... [more] |
ED2010-204 SDM2010-239 pp.67-72 |
ED, SDM |
2010-07-01 11:50 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
[Invited Talk]
Si single-dopant devices and their characterization Michiharu Tabe, Daniel Moraru, Earfan Hamid, Miftahul Anwar, Arief Udhiarto, Ryusuke Nakamura, Sakito Miki, Takeshi Mizuno (Shizuoka Univ.) ED2010-80 SDM2010-81 |
[more] |
ED2010-80 SDM2010-81 pp.131-136 |
SDM, CPM, ED |
2010-05-13 15:25 |
Shizuoka |
Shizuoka University (Hamamatsu Campus) |
Charging phenomena of a single electron in P-doped Si SOI-MOSFETs Earfan Hamid, Juli ChaTarido, Sakito Miki, Daniel Moraru, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-21 CPM2010-11 SDM2010-21 |
[more] |
ED2010-21 CPM2010-11 SDM2010-21 pp.23-26 |
SDM, CPM, ED |
2010-05-13 15:50 |
Shizuoka |
Shizuoka University (Hamamatsu Campus) |
Single Photon Detection in Single Dot and Multi Dot Channel Phosphorus-Doped SOI-FET Arief Udhiarto, Daniel Moraru, Ryusuke Nakamura, Sakito Miki, Takeshi Mizuno, Michiharu Tabe (Shiuzoka Univ.) ED2010-22 CPM2010-12 SDM2010-22 |
[more] |
ED2010-22 CPM2010-12 SDM2010-22 pp.27-31 |
ED, SDM |
2008-01-30 14:20 |
Hokkaido |
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Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope Maciej Ligowski (Shizuoka Univ./Warsaw Univ. of Tech.), Ratno Nuryadi, Akihiro Ichiraku, Miftahul Anwar (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2007-239 SDM2007-250 |
Dopant ionization was investigated by Kelvin Probe Force Microscope (KFM) measurements of surface potential of the thin ... [more] |
ED2007-239 SDM2007-250 pp.11-16 |
ED, SDM |
2008-01-30 14:45 |
Hokkaido |
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Design of dopant-induced quantum dot arrays in silicon nanostructures for single-electron transfer Daniel Moraru, Daisuke Nagata, Kiyohito Yokoi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.) ED2007-240 SDM2007-251 |
Randomly distributed dopants in the channel of silicon-on-insulator (SOI) field-effect transistors (FETs) can introduce ... [more] |
ED2007-240 SDM2007-251 pp.17-22 |
ED, SDM |
2007-06-25 13:00 |
Overseas |
Commodore Hotel Gyeongju Chosun, Gyeongju, Korea |
[Invited Talk]
Si single-electron FETs for single-photon detection Michiharu Tabe, Ratno Nuryadi, Zainal Burhanudin (Shizuoka Univ.) |
We have studied three research aspects as key technologies for breakthrough in Si devices, i.e., time-controlled transfe... [more] |
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SDM, ED |
2007-02-02 13:20 |
Hokkaido |
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Time-controlled single-electron transfer in single-gated asymmetric multiple tunnel junction arrays Daniel Moraru (Shizuoka Univ.), Yukinori Ono (NTT), Hiroshi Inokawa, Kiyohito Yokoi, Ratno Nuryadi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.) |
[more] |
ED2006-255 SDM2006-243 pp.83-88 |
SDM, ED |
2007-02-02 13:40 |
Hokkaido |
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Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors
-- Sensing the presence of a single-charge in the substrate -- Zainal Burhanudin, Ratno Nuryadi, Michiharu Tabe (Shizuoka Univ.) |
[more] |
ED2006-256 SDM2006-244 pp.89-94 |
ED, CPM, SDM |
2006-05-19 14:35 |
Aichi |
VBL, Toyohashi University of Technology |
Light irradiation effect on single-hole-tunneling current of an SOI-FET Zainal A. Burhanudin, Ratno Nuryadi, Michiharu Tabe (Shizuoka Univ.) |
[more] |
ED2006-39 CPM2006-26 SDM2006-39 pp.107-111 |
ED, CPM, SDM |
2006-05-19 15:00 |
Aichi |
VBL, Toyohashi University of Technology |
Tunneling current oscillations in Si/SiO2/Si structures Daniel Moraru, Daisuke Nagata (Shizuoka Univ.), Seiji Horiguchi (Akita Univ.), Ratno Nuryadi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.) |
[more] |
ED2006-40 CPM2006-27 SDM2006-40 pp.113-117 |
ED, SDM |
2006-01-26 13:30 |
Hokkaido |
Hokkaido Univ. |
- Yasuhiko Ishikawa, Tochihiro Yamamoto, Michiharu Tabe (Shizuoka Univ.) |
[more] |
ED2005-224 SDM2005-236 pp.1-6 |
ED, SDM |
2006-01-26 16:35 |
Hokkaido |
Hokkaido Univ. |
- Ratno Nuryadi, Yasuhiko Ishikawa, Michiharu Tabe (Shizuoka Univ.) |
[more] |
ED2005-230 SDM2005-242 pp.35-38 |
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