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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 18 of 18  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ED, CPM 2013-05-17
11:45
Shizuoka Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. Electron-tunneling operation of single-dopant-atom transistors at elevated temperature -- Toward room temperature operation --
Daniel Moraru, Earfan Hamid, Arup Samanta (Shizuoka Univ.), Le The Anh (JAIST), Takeshi Mizuno (Shizuoka Univ.), Hiroshi Mizuta (JAIST/Southampton Univ.), Michiharu Tabe (Shizuoka Univ.) ED2013-28 CPM2013-13 SDM2013-35
 [more] ED2013-28 CPM2013-13 SDM2013-35
pp.65-70
SDM, ED 2013-02-27
15:40
Hokkaido Hokkaido Univ. Individual Dopant Nature in Si Lateral Nano-pn Junctions
Sri Purwiyanti, Arief Udhiarto (Shizuoka Univ./Univ. Indonesia), Roland Nowak (Shizuoka Univ./Warsaw Univ. of Tech.), Daniel Moraru, Takeshi Mizuno (Shizuoka Univ.), Djoko Hartanto (Univ. Indonesia), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2012-132 SDM2012-161
In this work, we report the experimental observation of dopant signature in nanoscale ultra-thin SOI pn junctions. At te... [more] ED2012-132 SDM2012-161
pp.25-30
ED, SDM 2012-02-07
14:10
Hokkaido   Ab initio Analysis of Electronic States for Single Phosphorus Dopants in Silicon Nanorod Transistors
Youhei Kuzuya, Daniel Moraru, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.), Hiroshi Mizuta (JAIST/Univ. of Southampton) ED2011-143 SDM2011-160
Dopant-induced fluctuation of MOSFET characteristics along with device miniaturization has been recognized as a serious ... [more] ED2011-143 SDM2011-160
pp.7-11
ED, SDM 2012-02-07
14:35
Hokkaido   KFM observation of individual dopant potentials and electron charging
Roland Nowak, Miftahul Anwar, Daniel Moraru, Takeshi Mizuno (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2011-144 SDM2011-161
We utilize Kelvin probe force microscope (KFM) to measure surface potential of thin channel of nanoscale field effect tr... [more] ED2011-144 SDM2011-161
pp.13-18
SDM, ED 2011-02-24
10:20
Hokkaido Hokkaido Univ. Single-Electron Transfer between Two Donors in Thin Nanoscale Silicon Transistors
Daniel Moraru, Earfan Hamid, Juli Cha Tarido, Sakito Miki, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-202 SDM2010-237
 [more] ED2010-202 SDM2010-237
pp.57-62
SDM, ED 2011-02-24
11:10
Hokkaido Hokkaido Univ. Current Intermittency in SOI-FETs under Light Illumination
Arief Udhiarto, Daniel Moraru, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-204 SDM2010-239
We investigate the effects of continuous light illumination on single-electron transport via quantum dots in silicon-on-... [more] ED2010-204 SDM2010-239
pp.67-72
ED, SDM 2010-07-01
11:50
Tokyo Tokyo Inst. of Tech. Ookayama Campus [Invited Talk] Si single-dopant devices and their characterization
Michiharu Tabe, Daniel Moraru, Earfan Hamid, Miftahul Anwar, Arief Udhiarto, Ryusuke Nakamura, Sakito Miki, Takeshi Mizuno (Shizuoka Univ.) ED2010-80 SDM2010-81
 [more] ED2010-80 SDM2010-81
pp.131-136
SDM, CPM, ED 2010-05-13
15:25
Shizuoka Shizuoka University (Hamamatsu Campus) Charging phenomena of a single electron in P-doped Si SOI-MOSFETs
Earfan Hamid, Juli ChaTarido, Sakito Miki, Daniel Moraru, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-21 CPM2010-11 SDM2010-21
 [more] ED2010-21 CPM2010-11 SDM2010-21
pp.23-26
SDM, CPM, ED 2010-05-13
15:50
Shizuoka Shizuoka University (Hamamatsu Campus) Single Photon Detection in Single Dot and Multi Dot Channel Phosphorus-Doped SOI-FET
Arief Udhiarto, Daniel Moraru, Ryusuke Nakamura, Sakito Miki, Takeshi Mizuno, Michiharu Tabe (Shiuzoka Univ.) ED2010-22 CPM2010-12 SDM2010-22
 [more] ED2010-22 CPM2010-12 SDM2010-22
pp.27-31
ED, SDM 2008-01-30
14:20
Hokkaido   Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope
Maciej Ligowski (Shizuoka Univ./Warsaw Univ. of Tech.), Ratno Nuryadi, Akihiro Ichiraku, Miftahul Anwar (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2007-239 SDM2007-250
Dopant ionization was investigated by Kelvin Probe Force Microscope (KFM) measurements of surface potential of the thin ... [more] ED2007-239 SDM2007-250
pp.11-16
ED, SDM 2008-01-30
14:45
Hokkaido   Design of dopant-induced quantum dot arrays in silicon nanostructures for single-electron transfer
Daniel Moraru, Daisuke Nagata, Kiyohito Yokoi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.) ED2007-240 SDM2007-251
Randomly distributed dopants in the channel of silicon-on-insulator (SOI) field-effect transistors (FETs) can introduce ... [more] ED2007-240 SDM2007-251
pp.17-22
ED, SDM 2007-06-25
13:00
Overseas Commodore Hotel Gyeongju Chosun, Gyeongju, Korea [Invited Talk] Si single-electron FETs for single-photon detection
Michiharu Tabe, Ratno Nuryadi, Zainal Burhanudin (Shizuoka Univ.)
We have studied three research aspects as key technologies for breakthrough in Si devices, i.e., time-controlled transfe... [more]
SDM, ED 2007-02-02
13:20
Hokkaido   Time-controlled single-electron transfer in single-gated asymmetric multiple tunnel junction arrays
Daniel Moraru (Shizuoka Univ.), Yukinori Ono (NTT), Hiroshi Inokawa, Kiyohito Yokoi, Ratno Nuryadi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2006-255 SDM2006-243
pp.83-88
SDM, ED 2007-02-02
13:40
Hokkaido   Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors -- Sensing the presence of a single-charge in the substrate --
Zainal Burhanudin, Ratno Nuryadi, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2006-256 SDM2006-244
pp.89-94
ED, CPM, SDM 2006-05-19
14:35
Aichi VBL, Toyohashi University of Technology Light irradiation effect on single-hole-tunneling current of an SOI-FET
Zainal A. Burhanudin, Ratno Nuryadi, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2006-39 CPM2006-26 SDM2006-39
pp.107-111
ED, CPM, SDM 2006-05-19
15:00
Aichi VBL, Toyohashi University of Technology Tunneling current oscillations in Si/SiO2/Si structures
Daniel Moraru, Daisuke Nagata (Shizuoka Univ.), Seiji Horiguchi (Akita Univ.), Ratno Nuryadi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2006-40 CPM2006-27 SDM2006-40
pp.113-117
ED, SDM 2006-01-26
13:30
Hokkaido Hokkaido Univ. -
Yasuhiko Ishikawa, Tochihiro Yamamoto, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2005-224 SDM2005-236
pp.1-6
ED, SDM 2006-01-26
16:35
Hokkaido Hokkaido Univ. -
Ratno Nuryadi, Yasuhiko Ishikawa, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2005-230 SDM2005-242
pp.35-38
 Results 1 - 18 of 18  /   
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