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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS, VLD | 2023-03-01 11:50 |
Okinawa | (Primary: On-site, Secondary: Online) |
Acceleration of Memristor Modeling Based on Machine Learning Using Gaussian Process Yuta Shintani, Michiko Inoue (Naist), Michihiro Shintani (Kyoto Institute of Technology)  VLD2022-75 HWS2022-46 |
There has been a great deal of research into the development of domain-specific circuits for multiply-and-accumulate pro... [more] | VLD2022-75 HWS2022-46 pp.13-18 |
| HWS, VLD | 2023-03-01 13:25 |
Okinawa | (Primary: On-site, Secondary: Online) |
Programmable Binary Hyperdimensional Computing Accelerator for Low Power Devices Yuya Isaka (NAIST), Nau Sakaguchi (SJSU), Michiko Inoue (NAIST), Michihiro Shintani (KIT) VLD2022-76 HWS2022-47 |
Hyperdimensional computing (HDC) can perform various cognitive tasks efficiently by mapping data to hyperdimensional vec... [more] | VLD2022-76 HWS2022-47 pp.19-24 |
| HWS, VLD | 2023-03-02 13:25 |
Okinawa | (Primary: On-site, Secondary: Online) |
[Memorial Lecture]
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects Takuma Nagao (NAIST), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (Sony Semiconductor Manufacturing), Michiko Inoue (NAIST), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-91 HWS2022-62 |
Statistical wafer-level variation modeling is an attractive method for reducing the measurement cost in large-scale inte... [more] | VLD2022-91 HWS2022-62 p.109 |
| VLD, HWS [detail] | 2022-03-08 09:55 |
Online | Online | Wafer-Level Characteristic Variation Modeling with Considering Discontinuous Effect Caused by Manufacturing Equipment Takuma Nagao (National Institute of Technology (KOSEN)), Michihiro Shintani (Nara Institute of Science and Technology), Ken'ichi Yamaguchi, Hiroshi Iwata (National Institute of Technology (KOSEN)), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michiko Inoue (Nara Institute of Science and Technology) VLD2021-92 HWS2021-69 |
Statistical methods for predicting the performance of large-scale integrated circuits (LSIs) manufactured on a wafer are... [more] | VLD2021-92 HWS2021-69 pp.87-92 |
| COMP | 2021-10-23 14:30 |
Online | Online | Algorithms for Graph Class Identification Problems in the Population Protocol Model Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2021-17 |
In this paper, we focus on graph class identification problems in the population protocol model. A graph class identifi... [more] |
COMP2021-17 pp.20-27 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2021-03-26 10:40 |
Online | Online | Unsupervised Recycled FPGA Detection Using Direct Density Ratio Estimation Based on Self-referencing Yuya Isaka (KGU), Michihiro Shintani (NAIST), Foisal Ahmed (PU), Michiko Inoue (NAIST) CPSY2020-60 DC2020-90 |
It is well known that the performance of field-programmable gate-array (FPGA) degrades over time due to their usage. Sev... [more] | CPSY2020-60 DC2020-90 pp.61-66 |
| DC | 2021-02-05 10:55 |
Online | Online | Hardware Trojan Detection by Learning Power Side Channel Signals Considering Random Process Variation Michiko Inoue, Riaz-Ul-Haque Mian (NAIST) DC2020-70 |
Due to the globalization and complexity of the supply chain, there is a growing concern about the insertion of hardware ... [more] | DC2020-70 pp.7-11 |
| COMP, IPSJ-AL | 2020-09-02 10:30 |
Online | Online | Uniform Bipartition in Population Protocol Model over Arbitrary Communication Networks Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2020-8 |
In this paper, we focus on the uniform bipartition problem in the population protocol model. This problem aims to divide... [more] | COMP2020-8 pp.17-24 |
| COMP, IPSJ-AL | 2020-05-09 16:15 |
Online | Online | Gathering for mobile agents with a strong team in weakly Byzantine environments Jion Hirose, Masashi Tsuchida (NAIST), Junya Nakamura (TUT), Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2020-2 |
We study the gathering problem requiring a team of mobile agents to gather at a single node in arbitrary networks. The t... [more] | COMP2020-2 pp.9-16 |
| HWS, VLD [detail] | 2020-03-05 10:55 |
Okinawa | Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Fault-tolerant Design for Memristor Neural Network Using Checksum and Online Testing Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue (NAIST) VLD2019-112 HWS2019-85 |
[more] | VLD2019-112 HWS2019-85 pp.107-112 |
| DC | 2020-02-26 16:10 |
Tokyo | Accurate Recycled FPGA Detection Based on Exhaustive Path Analysis Michihiro Shintani, Foisal Ahmed, Michiko Inoue (NAIST) DC2019-96 |
[more] | DC2019-96 pp.61-66 |
|
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-13 10:55 |
Ehime | Ehime Prefecture Gender Equality Center | VLD2019-31 DC2019-55 |
In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] | VLD2019-31 DC2019-55 pp.13-18 |
| COMP, IPSJ-AL | 2019-05-11 15:10 |
Kumamoto | Kumamoto University | Ring Exploration Algorithms for Myopic Luminous Robots with Larger Visibility Shota Nagahama, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2019-7 |
In this paper, we investigate ring exploration algorithms for autonomous mobile robots. The robots are myopic, that is, ... [more] | COMP2019-7 pp.83-90 |
| DC | 2019-02-27 09:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Variational Autoencoder-Based Efficient Test Escape Detection Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72 |
[more] | DC2018-72 pp.7-12 |
| DC | 2019-02-27 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST) DC2018-75 |
Recently, counterfeited ICs have become a big problem for semiconductor supply chains. One of the countermeasures for th... [more] | DC2018-75 pp.25-30 |
| DC | 2019-02-27 11:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST) DC2018-77 |
Recycled field programmable gate arrays (FPGAs) make a significant threat to mission critical systems due to their perfo... [more] | DC2018-77 pp.37-42 |
| HWS, VLD | 2019-02-28 15:20 |
Okinawa | Okinawa Ken Seinen Kaikan | A SPICE Model Parameter Extraction Environment Using Automatic Differentiation Aoi Ueda (NNCT), Michihiro Shintani (NAIST), Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT), Michiko Inoue (NAIST) VLD2018-117 HWS2018-80 |
Accuracy of circuit simulation highly relys on two techniques: compact modeling and parameter extraction. As increasing ... [more] | VLD2018-117 HWS2018-80 pp.145-150 |
| HCGSYMPO (2nd) |
Mie | Sinfonia Technology Hibiki Hall Ise | - Naoto Kato, Michiko inoue, Shiraiwa Aya, Masashi Nishiyama, Yoshio Iwai (Tottori Univ) |
We investigate recognition performance between people and deep learning techniques using a simple task of visual inspect... [more] | ||
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 10:30 |
Hiroshima | Satellite Campus Hiroshima | VLD2018-50 DC2018-36 |
[more] | VLD2018-50 DC2018-36 pp.83-88 |
| COMP, IPSJ-AL | 2018-05-26 14:00 |
Aichi | Nagoya Institute of Technology | Obstruction detection by asynchronous opaque robots using lights Adam Heriban, Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2018-5 |
[more] | COMP2018-5 pp.71-78 |
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