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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]		 2016-11-28
15:30		 Osaka Ritsumeikan University, Osaka Ibaraki Campus (Osaka) Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46		 We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more]		 VLD2016-52 DC2016-46
pp.49-54
VLD 2015-03-03
09:40		 Okinawa Okinawa Seinen Kaikan (Okinawa) Methodology for Reduction of Timing Margin by Considering Correlation between Process Variation and BTI
Michitarou Yabuuchi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2014-163		 We analyze the efficiency of the design methodology by using circuit
simulations. The design methodology which consider... [more]		 VLD2014-163
pp.61-66
ICD, SDM 2014-08-05
14:55		 Hokkaido Hokkaido Univ., Multimedia Education Bldg. (Hokkaido) Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage
Azusa Oshima, Ryo Kishida, Michitarou Yabuuchi, Kazutoshi Kobayashi (KIT) SDM2014-79 ICD2014-48		 Reliability issues, such as plasma-induced damage (PID) and Bias Temperature
Instability (BTI), become dominant on inte... [more]		 SDM2014-79 ICD2014-48
pp.93-98
IPSJ-SLDM, CPSY, RECONF, VLD [detail] 2014-01-29
14:50		 Kanagawa Hiyoshi Campus, Keio University (Kanagawa) Prediction Model for Process Variation and BTI-Induced Degradation by Measurement Data on FPGA
Michitarou Yabuuchi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-129 CPSY2013-100 RECONF2013-83		 We propose a prediction model for BTI-induced degradation by
measurement data on 65nm-process FPGAs. BTI-induced degrad... [more]		 VLD2013-129 CPSY2013-100 RECONF2013-83
pp.161-166
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2013-11-28
13:20		 Kagoshima   (Kagoshima) Evaluations of Variations on Ring Oscillators from Plasma Induced Damage in Bulk and SOTB Processes
Ryo Kishida, Michitarou Yabuuchi, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-83 DC2013-49		 A degradation of reliability caused by plasma induced damage has become a significant concern with miniaturizing a devic... [more] VLD2013-83 DC2013-49
pp.159-164
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