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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2009-12-14 10:50 |
Shizuoka |
Shizuoka University (Hamamatsu) |
[Invited Talk]
Experimental Evaluation Technique for Power Supply Noise and Logical Operation Failure Mitsuya Fukazawa (Renesas Technology Corp.), Makoto Nagata (Kobe Univ.) ICD2009-77 |
Logical operations in CMOS digital integration are highly prone to fail as the amount of power supply (PS) drop approach... [more] |
ICD2009-77 pp.7-12 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-19 10:50 |
Fukuoka |
Kitakyushu Science and Research Park |
A Fast Simulation Technique of Processor Power Supply Noise using Capacitance Charging Model Fukuichi Iwasa, Takuya Sawada, Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.) CPM2008-94 ICD2008-93 |
A fast simulation technique is proposed for the power supply noise analysis of the large-scale digital processor. The an... [more] |
CPM2008-94 ICD2008-93 pp.31-36 |
ICD, SDM |
2007-08-24 08:55 |
Hokkaido |
Kitami Institute of Technology |
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura (Kobe Univ.), Rei Akiyama (Renesas Design), Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata (Renesas Technology), Makoto Nagata (Kobe Univ.) SDM2007-156 ICD2007-84 |
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring o... [more] |
SDM2007-156 ICD2007-84 pp.85-90 |
ICD, CPM |
2007-01-18 10:55 |
Tokyo |
Kika-Shinko-Kaikan Bldg. |
Delay Variation Analysis in Consideration of Dynamic Power Supply Noise Waveform Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.) |
Delay variability due to dynamic power supply noise is elucidated by on-chip signal waveform measurements at 100-ps/100-... [more] |
CPM2006-133 ICD2006-175 pp.25-29 |
ICD, ITE-CE |
2006-01-26 16:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Measurements of Digital Signal Delay Variation Due to Dynamic Power Supply Noise Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.) |
[more] |
ICD2005-214 pp.53-57 |
SIP, ICD, IE, IPSJ-SLDM |
2005-10-21 09:20 |
Miyagi |
Ichinobo, Sakunami-Spa |
Substrate Noise Reduction and Random Variability Neutralization with Self Adjusted Forward Body Bias Control Yoshihide Komatsu, Koichiro Ishibashi, Toshiro Tsukada, Masaharu Yamamoto (STARC), Kenji Shimazaki, Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.) |
[more] |
SIP2005-116 ICD2005-135 IE2005-80 pp.7-12 |
ICD |
2005-05-27 16:40 |
Hyogo |
Kobe Univ. |
Substrate Integrity Beyond 1GHz Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.), Naoyuki Hamanishi, Masazumi Shiochi, Tetsuya Iida (Toshiba Corp.), Junichiro Watanabe (Toshiba Information Systems(Japan) Corp.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec Corp.) |
(Advance abstract in Japanese is available) [more] |
ICD2005-39 pp.61-64 |
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