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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2009-12-14
10:50
Shizuoka Shizuoka University (Hamamatsu) [Invited Talk] Experimental Evaluation Technique for Power Supply Noise and Logical Operation Failure
Mitsuya Fukazawa (Renesas Technology Corp.), Makoto Nagata (Kobe Univ.) ICD2009-77
Logical operations in CMOS digital integration are highly prone to fail as the amount of power supply (PS) drop approach... [more] ICD2009-77
pp.7-12
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2008-11-19
10:50
Fukuoka Kitakyushu Science and Research Park A Fast Simulation Technique of Processor Power Supply Noise using Capacitance Charging Model
Fukuichi Iwasa, Takuya Sawada, Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.) CPM2008-94 ICD2008-93
A fast simulation technique is proposed for the power supply noise analysis of the large-scale digital processor. The an... [more] CPM2008-94 ICD2008-93
pp.31-36
ICD, SDM 2007-08-24
08:55
Hokkaido Kitami Institute of Technology Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs
Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura (Kobe Univ.), Rei Akiyama (Renesas Design), Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata (Renesas Technology), Makoto Nagata (Kobe Univ.) SDM2007-156 ICD2007-84
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring o... [more] SDM2007-156 ICD2007-84
pp.85-90
ICD, CPM 2007-01-18
10:55
Tokyo Kika-Shinko-Kaikan Bldg. Delay Variation Analysis in Consideration of Dynamic Power Supply Noise Waveform
Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.)
Delay variability due to dynamic power supply noise is elucidated by on-chip signal waveform measurements at 100-ps/100-... [more] CPM2006-133 ICD2006-175
pp.25-29
ICD, ITE-CE 2006-01-26
16:40
Tokyo Kikai-Shinko-Kaikan Bldg. Measurements of Digital Signal Delay Variation Due to Dynamic Power Supply Noise
Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.)
 [more] ICD2005-214
pp.53-57
SIP, ICD, IE, IPSJ-SLDM 2005-10-21
09:20
Miyagi Ichinobo, Sakunami-Spa Substrate Noise Reduction and Random Variability Neutralization with Self Adjusted Forward Body Bias Control
Yoshihide Komatsu, Koichiro Ishibashi, Toshiro Tsukada, Masaharu Yamamoto (STARC), Kenji Shimazaki, Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.)
 [more] SIP2005-116 ICD2005-135 IE2005-80
pp.7-12
ICD 2005-05-27
16:40
Hyogo Kobe Univ. Substrate Integrity Beyond 1GHz
Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.), Naoyuki Hamanishi, Masazumi Shiochi, Tetsuya Iida (Toshiba Corp.), Junichiro Watanabe (Toshiba Information Systems(Japan) Corp.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec Corp.)
(Advance abstract in Japanese is available) [more] ICD2005-39
pp.61-64
 Results 1 - 7 of 7  /   
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