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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 11 of 11  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2014-02-28
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Trend of practical technology in advanced low-k integration
Naoya Inoue (Renesas Electronics Corp.) SDM2013-166
Looking at the trend in Cu/Low-k interconnect technology, integration issues and solutions are discussed from the viewpo... [more] SDM2013-166
OFT 2013-01-25
Tokushima   Fabrication of polarization-maintaining photonic crystal fiber optical attenuator using air hole diameter control
Hirohisa Yokota, Naoya Inoue, Yuto Kobayashi, Yoh Imai (Ibaraki Univ.) OFT2012-62
Photonic crystal fiber (PCF) optical attenuators that are fabricated by air hole diameter control have advantages such a... [more] OFT2012-62
IBISML 2012-11-07
Tokyo Bunkyo School Building, Tokyo Campus, Tsukuba Univ. Online Large-margin Weight Learning for First-order Logic-based Abduction
Naoya Inoue, Kazeto Yamamoto, Yotaro Watanabe, Naoaki Okazaki, Kentaro Inui (Tohoku Univ.) IBISML2012-54
Abduction is inference to the best explanation. Abduction has long been studied in a wide range of contexts and is widel... [more] IBISML2012-54
SDM 2012-03-05
Tokyo Kikai-Shinko-Kaikan Bldg. Basic Performance of a Logic-IP Compatible eDRAM with Cylinder Capacitors in Low-k/Cu BEOL Layers
Ippei Kume, Naoya Inoue, Ken'ichiro Hijioka, Jun Kawahara, Koichi Takeda, Naoya Furutake, Hiroki Shirai, Kenya Kazama, Shin'ichi Kuwabara, Msasatoshi Watarai, Takashi Sakoh, Toshifumi Takahashi, Takashi Ogura, Toshiji Taiji, Yoshiko Kasama (Renesas Electronics) SDM2011-177
We have confirmed the basic performance of a Logic-IP compatible (LIC) eDRAM with cylinder capacitors in the low-k/Cu BE... [more] SDM2011-177
SDM 2012-03-05
Tokyo Kikai-Shinko-Kaikan Bldg. Highly Reliable BEOL-Transistor with oxygen-controlled InGaZnO channel and Gate/Drain Offset design
Kishou Kaneko, Naoya Inoue, Shinobu Saito, Naoya Furutake, Hiroshi Sunamura, Jun Kawahara, Masami Hane, Yoshihiro Hayashi (Renesas Electronics) SDM2011-178
Reliability of BEOL-transistors with a wide-gap oxide semiconductor InGaZnO film for high-voltage interface, integrated ... [more] SDM2011-178
SDM 2011-02-07
Tokyo Kikai-Shinko-Kaikan Bldg. Path-finding for Integration of Robust Low-k (k-2.5) SiOCH in System LSI
Naoya Inoue, Makoto Ueki, Hironori Yamamoto, Ippei Kume, Jun Kawahara, Manabu Iguchi, Hirokazu Honda, Yoshitaka Horikoshi, Yoshihiro Hayashi (Renesas Electronics Corp.) SDM2010-217
Impacts of k-value reduction on LSI performances are clarified quantitatively using 2M-gate net-list. Reduction in k-val... [more] SDM2010-217
IBISML 2010-11-05
Tokyo IIS, Univ. of Tokyo [Poster Presentation] SVM with weight learning for kernel parameters of each sample
Naoya Inoue, Yukihiko Yamashita (TOKYO TECH) IBISML2010-95
In the support vector machine (SVM) with an asymmetric kernel function, two mappings in the inner product to a high-dime... [more] IBISML2010-95
OFT 2010-10-25
Saitama Nippon Institute of Technology Fabrication of Photonic Crystal Fiber Attenuator with Air Hole Diameter Control Using CO2 Laser Irradiation
Hirohisa Yokota, Kousuke Ushiroda, Naoya Inoue, Yoh Imai, Yutaka Sasaki (Ibaraki Univ.) OFT2010-34
Photonic crystal fiber (PCF) attenuators with air hole diameter control were fabricated by PCF fusion using CO_2 laser i... [more] OFT2010-34
SDM 2010-02-05
Tokyo Kikai-Shinko-Kaikan Bldg. Highly-Reliable Cu Interconnect covered with CoWB Metal-cap in a Waterproof Molecular-Pore-Stack (MPS)-SiOCH film
Yoshihiro Hayashi, Masayoshi Tagami, Naoya Furutake, Naoya Inoue, Emiko Nakazawa, Kouji Arita (NEC Electronics) SDM2009-183
A new low-power copper (Cu) interconnect structure is developed with selective-metal (CoWB) cap, which selectively cover... [more] SDM2009-183
SDM 2010-02-05
Tokyo Kikai-Shinko-Kaikan Bldg. Defects in Cu/low-k Interconnects Probed Using Monoenergetic Positron Beams
Akira Uedono (Tsukuba Univ.), Naoya Inoue, Y. Hayashi, K. Eguchi, T. Nakamura, Y. Hirose, Masaki Yoshimaru (STARC), Nagayasu Oshima, Toshiyuki Ohdaira, R. Suzuki (National Institute of Advanced Industrial Science and Technology) SDM2009-190
Defects in SiOCH/Cu damascene structures were probed using monoenergetic positron beams. Doppler broadening spectra of t... [more] SDM2009-190
EA 2006-03-13
Tokyo   Estimation of sound source direction based on statistical model
Naoya Inoue, Takanori Nishino, Katsunobu Itou, Kazuya Takeda (Nagoya Univ.)
 [more] EA2005-108
 Results 1 - 11 of 11  /   
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