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 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS, VLD 2023-03-01
11:00
Okinawa
(Primary: On-site, Secondary: Online)
Measured Evaluation of BTI Degradation in a 65nm FDSOI Process using Ring Oscillators with Same Circuit Structure
Daisuke Kikuta (KIT), Ryo Kishida (TPU), Kazutoshi Kobayashi (KIT) VLD2022-73 HWS2022-44
(To be available after the conference date) [more] VLD2022-73 HWS2022-44
pp.1-6
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-14
09:15
Ehime Ehime Prefecture Gender Equality Center NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement
Takumi Hosaka (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), RYO Kishida (Tokyo Univ. of Science), Takashi Matsumoto (The Univ. of Tokyo), Kazutoshi Kobayashi (Kyoto Institute of Tech.) VLD2019-35 DC2019-59
In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on ... [more] VLD2019-35 DC2019-59
pp.57-62
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-07
14:10
Hiroshima Satellite Campus Hiroshima Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller
Hiroki Nakano (KIT), Ryo Kishida (TUS), Jun Furuta, Kazutoshi Kobayashi (KIT) CPM2018-95 ICD2018-56 IE2018-74
 [more] CPM2018-95 ICD2018-56 IE2018-74
pp.31-36
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
15:30
Osaka Ritsumeikan University, Osaka Ibaraki Campus Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46
We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more]
VLD2016-52 DC2016-46
pp.49-54
ICD, CPSY 2014-12-02
14:50
Tokyo Kikai-Shinko-Kaikan Bldg. Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process
Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.) ICD2014-106 CPSY2014-118
Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] ICD2014-106 CPSY2014-118
pp.123-128
ICD, SDM 2014-08-05
14:55
Hokkaido Hokkaido Univ., Multimedia Education Bldg. Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage
Azusa Oshima, Ryo Kishida, Michitarou Yabuuchi, Kazutoshi Kobayashi (KIT) SDM2014-79 ICD2014-48
Reliability issues, such as plasma-induced damage (PID) and Bias Temperature
Instability (BTI), become dominant on inte... [more]
SDM2014-79 ICD2014-48
pp.93-98
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2013-11-28
13:20
Kagoshima   Evaluations of Variations on Ring Oscillators from Plasma Induced Damage in Bulk and SOTB Processes
Ryo Kishida, Michitarou Yabuuchi, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-83 DC2013-49
A degradation of reliability caused by plasma induced damage has become a significant concern with miniaturizing a devic... [more] VLD2013-83 DC2013-49
pp.159-164
 Results 1 - 7 of 7  /   
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