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All Technical Committee Conferences (Searched in: Recent 10 Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HWS, VLD |
2023-03-01 11:00 |
Okinawa |
(Okinawa, Online) (Primary: On-site, Secondary: Online) |
Measured Evaluation of BTI Degradation in a 65nm FDSOI Process using Ring Oscillators with Same Circuit Structure Daisuke Kikuta (KIT), Ryo Kishida (TPU), Kazutoshi Kobayashi (KIT) VLD2022-73 HWS2022-44 |
(To be available after the conference date) [more] |
VLD2022-73 HWS2022-44 pp.1-6 |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 09:15 |
Ehime |
Ehime Prefecture Gender Equality Center (Ehime) |
NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement Takumi Hosaka (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), RYO Kishida (Tokyo Univ. of Science), Takashi Matsumoto (The Univ. of Tokyo), Kazutoshi Kobayashi (Kyoto Institute of Tech.) VLD2019-35 DC2019-59 |
In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on ... [more] |
VLD2019-35 DC2019-59 pp.57-62 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-07 14:10 |
Hiroshima |
Satellite Campus Hiroshima (Hiroshima) |
Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller Hiroki Nakano (KIT), Ryo Kishida (TUS), Jun Furuta, Kazutoshi Kobayashi (KIT) CPM2018-95 ICD2018-56 IE2018-74 |
[more] |
CPM2018-95 ICD2018-56 IE2018-74 pp.31-36 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:30 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus (Osaka) |
Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46 |
We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more] |
VLD2016-52 DC2016-46 pp.49-54 |
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