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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS, ICD, VLD 2025-03-07
12:05		 Okinawa (Okinawa, Online)
(Primary: On-site, Secondary: Online)		 Development of Hardware Trojans using Transistor Characteristics in Low Temperatures Environments
Ayano Takaya, Ryuichi Nakajima (Kyoto Inst. of Tech.), Jun Shiomi (Osaka Univ.), Michihiro Shintani (Kyoto Inst. of Tech.) 		 [more]
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
13:10		 Kumamoto Civic Auditorium Sears Home Yume Hall (Kumamoto, Online)
(Primary: On-site, Secondary: Online)		 Frequency Dependence of Soft Error Rates Induced by Alpha-Particle and Heavy Ion
Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36		  [more] VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36
pp.19-24
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
14:00		 Kumamoto Civic Auditorium Sears Home Yume Hall (Kumamoto, Online)
(Primary: On-site, Secondary: Online)		 Evaluation of SEU Sensitivity by Alpha-Particle on PMOS and NMOS Transistors in a 65 nm bulk Process
Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38		  [more] VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38
pp.31-36
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]		 2021-12-01
09:20		 Online Online (Online) Soft Errors on Flip-flops Depending on Circuit and Layout Structures Estimated by TCAD Simulations
Moeka Kotani, Ryuichi Nakajima (KIT), Kazuya Ioki (ROHM), Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25		 We compare the soft error tolerance of conventional flip-flops (FFs) and the proposed radiation-hard FF with small area,... [more] VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25
pp.1-6
OPE, R, CPM 2005-04-22
14:55		 Tokyo Kikai-Shinko-Kaikan Bldg. (Tokyo) Migration test of flexible substrate
Ikuo Yanase, Ryuichi Nakajima, Yasuo Imai, Sadao Suganuma (Oki Engineering) 		 [more] R2005-5 CPM2005-5 OPE2005-5
pp.21-27
 Results 1 - 5 of 5  /   
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