IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
KBSE 2017-01-23
13:20		 Tokyo Kikai-Shinko-Kaikan Bldg. Consideration of the effectiveness for error detection function about conceptual modeling education with state machine diagram made by beginners
Masaki Tajima, Mizue Kayama, Shinpei Ogata, Masami Hashimoto (Shinshu Univ.) KBSE2016-32		 The purpose of this study is to explore the suitable learning environment for conceptual modeling with UML. Our students... [more] KBSE2016-32
pp.7-12
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2015-12-02
15:55		 Nagasaki Nagasaki Kinro Fukushi Kaikan A low-power soft error tolerant latch scheme on 15nm process
Saki Tajima, Youhua Shi, Nozomu Togawa, Masao Yanagisawa (Waseda Univ.) VLD2015-56 DC2015-52		 In recent technology scaling, reliability of integrated circuits due to a soft error is becoming more critical than ever... [more] VLD2015-56 DC2015-52
pp.123-127
ET 2015-10-31
17:05		 Oita Nippon Bunri Univ. (Yufuin Training Institute) Development of a Model-Driven Development based Educational Model Compiler for UML Modeling Education for Designing Operation Control Method for Robot
Masaki Tajima, Mizue Kayama, Shinpei Ogata, Masami Hashimoto (Shinshu Univ.) ET2015-54		 The purpose of this study is to expand learning environment for UML modeling education. In our study, we focus on the e... [more] ET2015-54
pp.61-66
VLD 2015-03-03
09:15		 Okinawa Okinawa Seinen Kaikan A low-power soft error tolerant latch scheme
Saki Tajima, Youhua Shi, Nozomu Togawa, Masao Yanagisawa (Waseda Univ.) VLD2014-162		 In recent technology scaling, reduction of reliability by soft-error and increase power has appeared as an inevitable pr... [more] VLD2014-162
pp.55-60
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan