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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2019-12-20
Wakayama   Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test
Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] DC2019-85
IN 2004-10-15
Tokyo Kikai-Shinko-Kaikan Bldg. Design and Implementation of IPv6 Anycast Routing Protocol: PIA-SM
Satoshi Matsunaga (Osaka Univ.), Shingo Ata (Osaka City Univ.), Hiroshi Kitamura (NEC Corp.), Masayuki Murata (Osaka Univ.)
Today, the use of anycast address is quite limited. One of the reasons is because there is no routing protocol providing... [more] IN2004-92
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