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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2016-02-17
14:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding
Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-92		 Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage wi... [more] DC2015-92
pp.37-42
DC 2014-02-10
12:25		 Tokyo Kikai-Shinko-Kaikan Bldg. An Efficient Test Pattern Generator based on Mersenne Twister algorithm
Sayaka Satonaka, Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT) DC2013-86		 To perform a high reliable manufacturing test with a reasonable cost, LFSR is widely used as test pattern generator. How... [more] DC2013-86
pp.43-48
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