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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-06
10:55
Hiroshima Satellite Campus Hiroshima On the Generation of Random Capture Safe Test Vectors Using Neural Networks
Sayuri Ochi, Kenichirou Misawa, Toshinori Hosokawa, Yukari Yamauchi, Masayuki Arai (Nihon Univ.) VLD2018-51 DC2018-37
Excessive capture power consumption at scan testing causes the excessive IR drop and it might cause test-induced yield l... [more] VLD2018-51 DC2018-37
pp.89-94
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