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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
14:15
Osaka Ritsumeikan University, Osaka Ibaraki Campus Evaluation of Radiation-Hard Circuit Structures in a FDSOI Process by TCAD Simulations
Kodai Yamada, Haruki Maruoka, Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-49 DC2016-43
According to the Moore's law, LSIs are miniaturized and the
reliability of LSIs is degraded. To improve the tolerance ... [more]
VLD2016-49 DC2016-43
pp.31-36
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
14:40
Osaka Ritsumeikan University, Osaka Ibaraki Campus Evaluation of Soft Error Hardness of FinFET and FDSOI Processes by the PHITS-TCAD Simulation System
Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-50 DC2016-44
The impact of soft errors has been serious with process scaling of integrated circuits. Simulation methods for soft erro... [more] VLD2016-50 DC2016-44
pp.37-41
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
15:05
Osaka Ritsumeikan University, Osaka Ibaraki Campus Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions
Masashi Hifumi, Shigehiro Umehara, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-51 DC2016-45
We evaluate tolerance for soft errors of FFs on a 28/65 nm FDSOI. We fabricated three different layouts of non-redundant... [more] VLD2016-51 DC2016-45
pp.43-48
 Results 1 - 3 of 3  /   
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