|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM |
2009-07-16 15:25 |
Tokyo |
Tokyo Institute of Technology |
Comprehensive Design Methodology of Dopant Profile to Suppress Gate-LER-induced Threshold Voltage Variability in sub-30 nm NMOSFETs Hidenobu Fukutome (Fujitsu Microelectronics Limited), Yoko Hori (Fujitsu Quality Lab. Limited), Kimihiko Hosaka, Yoichi Momiyama, Shigeo Satoh, Toshihiro Sugii (Fujitsu Microelectronics Limited) SDM2009-106 ICD2009-22 |
We have demonstrated for the first time that parallel extension implantation tilted along the gate width direction enabl... [more] |
SDM2009-106 ICD2009-22 pp.49-52 |
ICD, SDM |
2008-07-18 15:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
High Performance Sub-35 nm Bulk CMOS with Hybrid Gate Structures of NMOS; Dopant Confinement Layer (DCL) / PMOS; Ni-FUSI by Using Flash Lamp Anneal (FLA) in Ni-Silicidation
-- Hybrid Gate Structures -- Hiroyuki Ohta (Fujitsu Lab.), Kazuo Kawamura (FML), Hidenobu Fukutome (Fujitsu Lab.), Mitsugu Tajima, Ken-ichi Okabe (FML), Keiji Ikeda, Kimihiko Hosaka, Yoichi Momiyama, Shigeo Satoh, Toshihiro Sugii (Fujitsu Lab.) SDM2008-148 ICD2008-58 |
We applied Flash Lamp Annealing (FLA) in Ni-silicidation to our developed Dopant Confinement Layer (DCL) structure for t... [more] |
SDM2008-148 ICD2008-58 pp.115-120 |
ICD, SDM |
2005-08-19 15:15 |
Hokkaido |
HAKODATE KOKUSAI HOTEL |
High-k; Last Card for the Leakage Currents Tadayoshi Enomoto (Chuo Univ.), Mariko Takayanagi (Toshiba), Shigeo Satoh (Fujitu), Koji Nii (Renesas), Akira Nishiyama (Toshiba), ハセ タカシ (NEC), Mototsugu Hamada (Toshiba), Jiro Yugami (Renesas) |
(Advance abstract in Japanese is available) [more] |
SDM2005-155 ICD2005-94 pp.73-78 |
ICD |
2005-04-15 14:30 |
Fukuoka |
|
New Development of Neutron-induced Soft-Error Simulation Technology Taiki Uemura, Yoshiharu Tosaka, Yoshio Ashizawa, Hideki Oka, Shigeo Satoh (Fujitsu lab.) |
In these years, the interest in soft error becomes increasing. This comes from the problem that the soft error occurs no... [more] |
ICD2005-19 pp.37-42 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|