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All Technical Committee Conferences  (Searched in: Recent 10 Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 20  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SS 2025-03-10
10:45
Kagoshima (Kagoshima) Investigating the generalization and robustness performance of CNN models when using RAdam
Yusuke Yasuda, Kozo Okano, shinpei Ogata (SU), Shin Nakajima (NII)
 [more]
SS 2025-03-10
17:20
Kagoshima (Kagoshima) A Robustness Testing Method for Large Language Models Using Multiple-Choice Questions and an Analysis of the Temperature Effects
Tatsuto Ota, Kozo Okano, Shinpei Ogata (Shinshu Univ), Shin Nakajima (NII)
 [more]
KBSE 2025-01-23
15:05
Osaka Osaka Kyoiku University(Tennoji) (Osaka, Online)
(Primary: On-site, Secondary: Online)
Quality Management of AI Systems equipped with LLMs -- Inside the AIQM Guideline --
Shin Nakajima, Koichi Konishi, Yoshiki Seo, Yutaka Oiwa (AIST) KBSE2024-43
A series of Machine Learning Quality Management Guidelines have been published since 2020 as a basis for developing mach... [more] KBSE2024-43
pp.25-30
KBSE, SS, IPSJ-SE [detail] 2024-07-25
14:00
Hokkaido (Hokkaido, Online)
(Primary: On-site, Secondary: Online)
Privacy protection of training datasets in CNN transfer learning models
Takumi Katsuie, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) SS2024-1 KBSE2024-7
Transfer learning, one of the machine learning methods, has attracted attention as a technique that can create highly ac... [more] SS2024-1 KBSE2024-7
pp.1-6
KBSE, SS, IPSJ-SE [detail] 2024-07-25
14:30
Hokkaido (Hokkaido, Online)
(Primary: On-site, Secondary: Online)
Debugging and testing of training datasets using internal activation states of CNN models
Daichi Ofuchi, Takumi Katsuie, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) SS2024-2 KBSE2024-8
Recently, Artificial Intelligence (AI) and machine learning technologies have made great achievements in various fields.... [more] SS2024-2 KBSE2024-8
pp.7-12
SS, DC 2023-10-12
10:25
Nagano (Nagano, Online)
(Primary: On-site, Secondary: Online)
Robustness trends of DP-SGD, a machine learning with differential privacy
Takahiro Kanki, Shinpei Ogata, Kozo Okano (Sinshu Univ), Shin Nakajima (NII) SS2023-28 DC2023-34
Although machine learning has been successful in various fields, there is a problem that an adversary can extract traini... [more] SS2023-28 DC2023-34
pp.38-43
SS 2023-03-15
13:45
Okinawa (Okinawa, Online)
(Primary: On-site, Secondary: Online)
Improvement of Encoding and Ablation Methods in Fault Localization by Ablation
Takuma Ikeda, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) SS2022-67
Spectrum-based Fault Localization (SFL) is a technique to locate faults in source code using execution traces. A method ... [more] SS2022-67
pp.121-126
DC, SS 2022-10-25
13:00
Fukushima   (Fukushima, Online)
(Primary: On-site, Secondary: Online)
[Invited Talk] Privacy as Ethical Quality Characteristics of AI
Shin Nakajima (NII) SS2022-25 DC2022-31
 [more] SS2022-25 DC2022-31
p.22
DC, SS 2022-10-25
14:15
Fukushima   (Fukushima, Online)
(Primary: On-site, Secondary: Online)
Relationship between the Defects in Learning Programs and the Model Distortion on the Convolutional Neural Networks
Takumi Tsuchiya, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) SS2022-26 DC2022-32
In recent years, the quality issue of machine learning software has become an important concern. When considering the qu... [more] SS2022-26 DC2022-32
pp.23-28
SS 2022-03-07
11:20
Online Online (Online) Trace Ablation and Fault Localization per Method Using Machine Learning Models for Automatic Classification of Test Execution Results
Takuma Ikeda, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) SS2021-44
The problem to solve automatically classifying the results of test executions is called the test oracle problem. This is... [more] SS2021-44
pp.13-18
SS, MSS 2022-01-12
09:15
Nagasaki Nagasakiken-Kensetsu-Sogo-Kaikan Bldg. (Nagasaki, Online)
(Primary: On-site, Secondary: Online)
Execution-trace embedding using word-proximity metric for a method to automatically classify test results
Takuma Ikeda, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) MSS2021-46 SS2021-33
The problem to solve automatically classifying the results of test executions is called the test oracle problem. This is... [more] MSS2021-46 SS2021-33
pp.83-88
SS 2020-03-04
14:20
Okinawa (Okinawa)
(Cancelled but technical report was issued)
Distortion Metrics for Trained Machine Learning Models
Shin Nakajima (NII) SS2019-44
 [more] SS2019-44
pp.19-24
SS, MSS 2020-01-15
10:30
Hiroshima (Hiroshima) MSS2019-51 SS2019-35  [more] MSS2019-51 SS2019-35
pp.61-66
SS 2019-03-05
15:00
Okinawa (Okinawa) Quality Evaluation Asssurance Levels for Machine Learning Software
Shin Nakajima (NII), Yoshiki Seo, Yutaka Oiwa, Yoshinao Isobe (AIST) SS2018-79
 [more] SS2018-79
pp.163-168
KBSE, SC 2018-11-09
13:00
Hyogo (Hyogo) Quality of Machine Learning Software: Products, Services, Platform
Shin Nakajima (NII) KBSE2018-31 SC2018-26
 [more] KBSE2018-31 SC2018-26
pp.19-24
SS 2018-03-07
15:30
Okinawa (Okinawa) Uncertainty in Machine Learning Software from Quality Assurance Viewpoints
Shin Nakajima (NII) SS2017-77
 [more] SS2017-77
pp.75-80
SS 2017-03-09
10:20
Okinawa (Okinawa) Debugging Pure Strategy Games
Shin Nakajima (NII) SS2016-62
 [more] SS2016-62
pp.13-18
KBSE, SS, IPSJ-SE [detail] 2016-07-13
09:50
Hokkaido (Hokkaido) Testing Quasi-testable Core of Non-testable Program
Shin Nakajima (NII), Bui Ngoc Hai (VNU) SS2016-1 KBSE2016-7
 [more] SS2016-1 KBSE2016-7
pp.1-6
KBSE, SS, IPSJ-SE [detail] 2015-07-24
10:40
Hokkaido (Hokkaido) Two-Staged Modeling Method with Alloy and Event-B
Shin Nakajima (NII) SS2015-32 KBSE2015-25
 [more] SS2015-32 KBSE2015-25
pp.161-166
SS 2015-03-09
10:20
Okinawa OKINAWAKEN SEINENKAIKAN (Okinawa) SNIPER: An LLVM-based Automatic Fault Localization Tool for Imperative Programs
Si-Mohamed Lamraoui, Shin Nakajima (NII) SS2014-57
 [more] SS2014-57
pp.13-18
 Results 1 - 20 of 20  /   
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