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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC
(Joint) [detail]
2007-11-22
09:25
Fukuoka Kitakyushu International Conference Center A New Technique for Elimination of Irregular Data in Measured Values -- A Data Screening Technique Appling Skewness of Basic Statistic --
Shin-ichi Ohkawa, Hiroo Masuda (Renesas) VLD2007-90 DC2007-45
Consideration of device variation in VLSI design, at present or in future, is very important concerns. Moreover, in each... [more] VLD2007-90 DC2007-45
pp.7-12
SDM, VLD 2007-10-31
15:00
Tokyo Kikai-Shinko-Kaikan Bldg. Scaled CMOS Modeling on Analog Small Signal parameters
Takeshi Kida, Shin-ichi Ohkawa, Hiroo Masuda (Renesas) VLD2007-67 SDM2007-211
In sub-100-nm device, mismatch characteristics of threshold voltage and drain current have been degraded. This phenomeno... [more] VLD2007-67 SDM2007-211
pp.35-39
SDM, VLD 2007-10-31
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. Technical Trends of Mismatch Modeling on Analog CMOS Circuit
Hiroo Masuda, Takeshi Kida, Shin-ichi Ohkawa (Renesas) VLD2007-69 SDM2007-213
In sub-100-nm device, mismatch characteristics of threshold voltage and drain current have been degraded. This phenomeno... [more] VLD2007-69 SDM2007-213
pp.47-54
ICD, VLD 2007-03-09
16:00
Okinawa Mielparque Okinawa Characteristic of Random Curved Surface and a Proposition of a New Curved Surface Model -- An Universal Random Curved Surface Model Formed from Rotational Gaussians --
Shin-ichi Ohkawa, Hiroo Masuda (Renesas)
In previous paper, we showed a random Legendre polynomial surface model in two-dimensions. It can be used to represent s... [more] VLD2006-155 ICD2006-246
pp.87-92
ICD, ITE-CE 2006-12-15
09:25
Hiroshima   A Novel Expression of Spatial Correlation with Random Curved Surface -- The Methodology of Consideration of Systematic Variation in LSI Design --
Shin-ichi Ohkawa (Renesas), Masakazu Aoki (Tokyo University of Science, SUWA), Hiroo Masuda (Renesas)
 [more] ICD2006-159
pp.91-96
ICD, ITE-CE 2006-12-15
09:50
Hiroshima   Modeling and Simulation of Mismatch Characteristics on Analog CMOS Circuits
Takeshi Kida, Shin-ichi Ohkawa, Hiroo Masuda (Renesas)
 [more] ICD2006-160
pp.97-102
 Results 1 - 6 of 6  /   
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