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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-22 09:25 |
Fukuoka |
Kitakyushu International Conference Center |
A New Technique for Elimination of Irregular Data in Measured Values
-- A Data Screening Technique Appling Skewness of Basic Statistic -- Shin-ichi Ohkawa, Hiroo Masuda (Renesas) VLD2007-90 DC2007-45 |
Consideration of device variation in VLSI design, at present or in future, is very important concerns. Moreover, in each... [more] |
VLD2007-90 DC2007-45 pp.7-12 |
SDM, VLD |
2007-10-31 15:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Scaled CMOS Modeling on Analog Small Signal parameters Takeshi Kida, Shin-ichi Ohkawa, Hiroo Masuda (Renesas) VLD2007-67 SDM2007-211 |
In sub-100-nm device, mismatch characteristics of threshold voltage and drain current have been degraded. This phenomeno... [more] |
VLD2007-67 SDM2007-211 pp.35-39 |
SDM, VLD |
2007-10-31 15:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Technical Trends of Mismatch Modeling on Analog CMOS Circuit Hiroo Masuda, Takeshi Kida, Shin-ichi Ohkawa (Renesas) VLD2007-69 SDM2007-213 |
In sub-100-nm device, mismatch characteristics of threshold voltage and drain current have been degraded. This phenomeno... [more] |
VLD2007-69 SDM2007-213 pp.47-54 |
ICD, VLD |
2007-03-09 16:00 |
Okinawa |
Mielparque Okinawa |
Characteristic of Random Curved Surface and a Proposition of a New Curved Surface Model
-- An Universal Random Curved Surface Model Formed from Rotational Gaussians -- Shin-ichi Ohkawa, Hiroo Masuda (Renesas) |
In previous paper, we showed a random Legendre polynomial surface model in two-dimensions. It can be used to represent s... [more] |
VLD2006-155 ICD2006-246 pp.87-92 |
ICD, ITE-CE |
2006-12-15 09:25 |
Hiroshima |
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A Novel Expression of Spatial Correlation with Random Curved Surface
-- The Methodology of Consideration of Systematic Variation in LSI Design -- Shin-ichi Ohkawa (Renesas), Masakazu Aoki (Tokyo University of Science, SUWA), Hiroo Masuda (Renesas) |
[more] |
ICD2006-159 pp.91-96 |
ICD, ITE-CE |
2006-12-15 09:50 |
Hiroshima |
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Modeling and Simulation of Mismatch Characteristics on Analog CMOS Circuits Takeshi Kida, Shin-ichi Ohkawa, Hiroo Masuda (Renesas) |
[more] |
ICD2006-160 pp.97-102 |
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